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DAC8551IADGKRG4 Datasheet, PDF (9/26 Pages) Texas Instruments – 16-BIT, ULTRA-LOW GLITCH, VOLTAGE OUTPUT
DAC8551
www.ti.com
SLAS429B – APRIL 2005 – REVISED OCTOBER 2006
TYPICAL CHARACTERISTICS: VDD = 5 V (continued)
At TA = +25°C, unless otherwise noted.
GLITCH ENERGY: 5V, 16LSB STEP, FALLING EDGE
GLITCH ENERGY: 5V, 256LSB STEP, RISING EDGE
VDD = 5V
VREF = 4.096V
From Code: 8010
To Code: 8000
Glitch: 0.08nV-s
Time (400ns/div)
Figure 19.
GLITCH ENERGY: 5V, 256LSB STEP, FALLING EDGE
VDD = 5V
VREF = 4.096V
From Code: 80FF
To Code: 8000
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Figure 21.
SIGNAL-TO-NOISE RATIO
vs OUTPUT FREQUENCY
98 VREF = VDD = 5V
96
-1dB FSR Digital Input
fS = 1MSPS
94 Measurement Bandwidth = 20kHz
92
90
88
86
84
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.5
fOUT (kHz)
Figure 23.
VDD = 5V
VREF = 4.096V
From Code: 8000
To Code: 80FF
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Figure 20.
TOTAL HARMONIC DISTORTION
vs OUTPUT FREQUENCY
-40
VDD = 5V
-50
VREF = 4.9V
-1dB FSR Digital Input
fS = 1MSPS
-60 Measurement Bandwidth = 20kHz
-70
THD
-80
-90
2nd Harmonic
3rd Harmonic
-100
0
1
2
3
4
5
fOUT (kHz)
Figure 22.
-10
-30
-50
-70
-90
-110
-130
0
POWER SPECTRAL DENSITY
VDD = 5V
VREF = 4.096V
fOUT = 1kHz
f = 1MSPS
CLK
5
10
15
20
Frequency (kHz)
Figure 24.
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