DAC8551IADGKRG4 Datasheet, PDF (3/26 Pages) Texas Instruments – 16-BIT, ULTRA-LOW GLITCH, VOLTAGE OUTPUT

DAC8551
www.ti.com
SLAS429B – APRIL 2005 – REVISED OCTOBER 2006
ELECTRICAL CHARACTERISTICS (continued)
V_DD = 2.7V to 5.5V,and –40°C to +105°C range, unless otherwise noted.
PARAMETER
TEST CONDITIONS
OUTPUT CHARACTERISTICS⁽²⁾
Output voltage range
Output voltage settling time
Slew rate
To ±0.003% FSR, 0200h to FD00h, R_L = 2kΩ,
0pF < C_L < 200pF
R_L = 2kΩ, C_L = 50 pF
Capacitive load stability
Code change glitch impulse
R_L = ∞
R_L = 2kΩ
1LSB change around major carry
Digital feedthrough
50kΩ series resistance on digital lines
DC output impedance
At mid-code input
Short-circuit current
Power-up time
AC PERFORMANCE
V_DD = 5V
V_DD = 3V
Coming out of power-down mode, V_DD = 5V
Coming out of power-down mode, V_DD = 3V
SNR
THD
SFDR
BW = 20kHz, V_DD = 5V, f_OUT = 1kHz, 1st 19 harmonics removed
for SNR calculation
SINAD
REFERENCE INPUT
Reference current
Reference input range
V_REF = V_DD = 5V
V_REF = V_DD = 3.6V
Reference input impedance
LOGIC INPUTS⁽²⁾
Input current
V_INL Input LOW voltage
V_INH Input HIGH voltage
Pin capacitance
V_DD = 5V
V_DD = 3V
V_DD = 5V
V_DD = 3V
POWER REQUIREMENTS
V_DD
I_DD
(normal mode)
V_DD = 3.6V to 5.5V
V_DD = 2.7V to 3.6V
I_DD
(all power-down modes)
V_DD = 3.6V to 5.5V
V_DD = 2.7V to 3.6V
POWER EFFICIENCY
Input code = 32768, no load, does not include reference current
V_IH = V_DD and V_IL = GND
V_IH = V_DD and V_IL = GND
I_OUT/I_DD
TEMPERATURE RANGE
I_LOAD = 2mA, V_DD = 5V
Specified performance
MIN
TYP
MAX
UNIT
0
V_REF
V
8
10
µs
12
1.8
470
1000
0.1
0.1
1
50
20
2.5
5
µs
V/µs
pF
pF
nV-s
Ω
mA
µs
95
–85
dB
87
84
40
75
µA
30
45
µA
0
V_DD
V
125
kΩ
±1
µA
0.8
V
0.6
2.4
V
2.1
3
pF
2.7
5.5
V
160
250
µA
140
240
0.2
2
µA
0.05
2
89
%
–40
+105
°C
(2) Specified by design and characterization; not production tested.
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