THS1206IDAR Datasheet, PDF (5/43 Pages) Texas Instruments – 12-BIT, 4 ANALOG INPUT, 6 MSPS, SIMULTANEOUS SAMPLINGANALOG TO-DIGITAL CONVERTERS

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THS1206
SLAS217H – MAY 1999 – REVISED JULY 2003#
ELECTRICAL CHARACTERISTICS
over recommended operating conditions, VREF = internal, fx = 6 MHz, fI = 2 MHz at –1 dBFS (unless otherwise noted)
AC SPECIFICATIONS, AVDD = 5 V, BVDD = DVDD = 3.3 V, CL = <30 pF
PARAMETER
TEST CONDITIONS
MIN TYP
SINAD Signal-to-noise ratio + distortion
Differential mode
Single-ended mode(1)
63
65
64
SNR Signal-to-noise ratio
Differential mode
Single-ended mode(1)
64
69
68
THD Total harmonic distortion
C and I suffix
–70
Differential mode
Q and M suffix
–70
C and I suffix
–68
Single-ended mode
Q and M suffix
–68
ENOB
(SNR) ^{Effective number of bits}
Differential mode
Single-ended mode(1)
10.17
11
10.4
SFDR Spurious free dynamic range
Differential mode
Single-ended mode
67
71
69
Analog Input
Full-power bandwidth with a source impedance of
150 Ω in differential configuration.
FS sinewave, –3 dB
96
Full-power bandwidth with a source impedance of
150 Ω in single-ended configuration.
FSl sinewave, –3 dB
54
Small-signal bandwidth with a source impedance of
150 Ω in differential configuration.
100 mVpp sinewave, –3 dB
96
Small-signal bandwidth with a source impedance of
150 Ω in single-ended configuration.
100 mVpp sinewave, –3 dB
54
MAX
–67
–67
UNIT
dB
dB
dB
dB
dB
Bits
Bits
dB
dB
MHz
MHz
MHz
MHz
TIMING SPECIFICATIONS⁽¹⁾
AVDD = 5 V, BVDD = DVDD = 3.3 V, VREF = internal, CL < 30 pF
PARAMETER
td(DATA_AV)
td(o)
Delay time
Delay time
tpipe
Latency
(1) _{See Figure 25.}
TEST CONDITIONS
MIN TYP MAX UNIT
5
ns
5
ns
5
CONV
CLK
5