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THS1030_13 Datasheet, PDF (5/39 Pages) Texas Instruments – 3-V TO 5.5-V, 10-BIT, 30MSPS CMOS ANALOG-TO-DIGITAL CONVERTER
THS1030
3ĆV TO 5.5ĆV, 10ĆBIT, 30 MSPS
CMOS ANALOGĆTOĆDIGITAL CONVERTER
SLAS243E − NOVEMBER 1999 − REVISED DECEMBER 2003
electrical characteristics over recommended operating conditions, AVDD = 3 V, DVDD = 3 V, fs = 30
MSPS/50% duty cycle, MODE = AVDD, 2-V input span from 0.5 V to 2.5 V, external reference,
TA = Tmin to Tmax (unless otherwise noted) (continued)
dc accuracy
PARAMETER
MIN TYP MAX UNIT
INL
Integral nonlinearity (see Note 2)
± 1 ± 2 LSB
DNL Differential nonlinearity (see Note 3)
± 0.3 ± 1 LSB
Offset error (see Note 4)
0.4 1.4 %FSR
Gain error (see Note 5)
1.4 3.5 %FSR
Missing code
No missing code assured
NOTES:
2. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero
occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond the last code transition. The
deviation is measured from the center of each particular code to the true straight line between these two endpoints.
3. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure
indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under
test (i.e., (last transition level – first transition level) ÷ (2 n – 2)). Using this definition for DNL separates the effects of gain and offset
error. A minimum DNL better than –1 LSB ensures no missing codes.
4. Offset error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that will switch
the ADC output from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the
bottom reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by
the number of ADC output levels (1024).
5. Gain error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that will switch
the ADC output from code 1022 to code 1023. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5
LSB from the top reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references
divided by the number of ADC output levels (1024).
dynamic performance (See Note 6)
PARAMETER
TEST CONDITIONS
f = 3.5 MHz
ENOB Effective number of bits
f = 3.5 MHz, AVDD = 5 V
f = 15 MHz, 3 V
f = 15 MHz, AVDD = 5 V
f = 3.5 MHz
SFDR Spurious free dynamic range
f = 3.5 MHz, AVDD = 5 V
f = 15 MHz
f = 15 MHz, AVDD = 5 V
f = 3.5 MHz
THD Total harmonic distortion
f = 3.5 MHz, AVDD = 5 V
f = 15 MHz
f = 15 MHz, AVDD = 5 V
f = 3.5 MHz
SNR Signal-to-noise ratio
f = 3.5 MHz, AVDD = 5 V
f = 15 MHz
f = 15 MHz, AVDD = 5 V
f = 3.5 MHz
SINAD Signal-to-noise and distortion
f = 3.5 MHz, AVDD = 5 V
f = 15 MHz
f = 15 MHz, AVDD = 5 V
NOTES: 6. Input amplitude of single tone sine wave for dynamic tests is −0.5 dBFS.
MIN TYP
8.4
9
9
7.8
7.7
56 60.6
64.6
48.5
53
− 60
− 66.9
− 47.5
− 53.1
53
57
56
53.1
49.4
52.5
56
56
48.6
48.1
MAX
− 56
UNIT
Bits
dB
dB
dB
dB
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