GC6016 Datasheet, PDF (39/46 Pages) Texas Instruments – Wideband Transmit-Receive Digital Signal Processors

GC6016
www.ti.com
SLWS227A – NOVEMBER 2010 – REVISED MARCH 2011
Table 26. MPU Switching Characteristics (READ)
t_su(RD)
t_dly(RD)
t_h(RD)
t_HIGH(RD)
t_z(RD)
t_cycle(RD)
t_oh(RD)
PARAMETER
CEB and ADDR setup time to ↓OEB
Data valid time after ↓OEB
CEB and ADDR hold time to ↑OEB
Time OEB must remain HIGH between READs
Data goes to high-impedance state after ↑OEB or ↑CEB
Time between READs
Time after OEB↑ that data is valid
See ⁽¹⁾
See ⁽¹⁾
See ⁽¹⁾
See ⁽¹⁾
See ⁽²⁾
See ⁽¹⁾
See ⁽²⁾
TEST CONDITIONS
MIN MAX
1.5
15
2.5
6
5
21
TBD
UNIT
ns
ns
ns
ns
ns
ns
ns
(1) Chip specifications are production tested at 90°C case temperature for the given specification. Early production lots are sample tested
at –40°C.
(2) Bench tested for output start changing after releasing strobe with a 50-Ω load on the output
CEB
Addr
WEB
t_su(RD)
t_su(RD)
t_h(RD)
t_h(RD)
OEB
Data
t_dly(RD)
t_z(RD)
t_oh(RD)
Figure 25. MPU READ Timing Specifications
T0517-01
Table 27. MPU Switching Characteristics (WRITE)
t_su(WR)
t_h(WR)
t_low(WR)
t_high(WR)
t_cycle(WR)
PARAMETER
CEB, DATA, and ADDR setup time to ↓WEB
CEB, DATA, and ADDR hold time after ↑WEB
Time WEB and CEB must remain simultaneously LOW
Time CEB or WRB must remain HIGH between WRITEs
Time between WRITEs
TEST CONDITIONS
See ⁽¹⁾
See ⁽¹⁾
See ⁽¹⁾
See ⁽¹⁾
See ⁽¹⁾
MIN MAX
1.4
3
4
7
11
UNIT
ns
ns
ns
ns
ns
(1) Chip specifications are production tested at 90°C case temperature for the given specification. Early production lots are sample tested
at –40°C.
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