TCA8418E_15 Datasheet, PDF (13/50 Pages) Texas Instruments – I2C Controlled Keypad Scan IC With Integrated ESD Protection

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TCA8418E
SCPS222C – MAY 2010 – REVISED OCTOBER 2015
Parameter Measurement Information (continued)
DUT
Pn
C_L = 50 pF
(see Note A)
500 W
500 W
2 ´ V_CC
P-PORT LOAD CONFIGURATION
SCL
SDA
Pn
0.7 ´ V_CC
P0
A
P3
0.3 ´ V_CC
Slave
ACK
t_pv
(see Note B)
Unstable
Data
Last Stable Bit
WRITE MODE (R/W = 0)
SCL
Pn
P0
t_ps
A
P3
t_ph
0.7 ´ V_CC
0.3 ´ V_CC
0.5 ´ V_CC
READ MODE (R/W = 1)
A. C_L includes probe and jig capacitance.
B. t_pv is measured from 0.7 × V_CC on SCL to 50% I/O (Pn) output.
C. All inputs are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Z_O = 50 Ω, t_r/t_f ≤ 30 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. All parameters and waveforms are not applicable to all devices.
Figure 18. P Port Load Circuit and Timing Waveforms
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