MSP430F2619S-HT Datasheet, PDF (32/90 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430F2619S-HT
SLAS697B – MARCH 2010 – REVISED JUNE 2011
www.ti.com
Schmitt-Trigger Inputs (Ports P1 Through P6, and RST/NMI, JTAG, XIN, and XT2IN)⁽¹⁾ –
Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
V_IT+ Positive-going input threshold voltage
TEST CONDITIONS
V_CC
2.2 V
MIN
0.45 x
V_CC
1.00
TYP
3V
1.35
V_IT– Negative-going input threshold voltage
2.2 V
0.25 x
V_CC
0.55
3V
0.75
V_hys Input voltage hysteresis (V_IT+ – V_IT–)
2.2 V
0.2
3V
0.3
R_Pull Pullup/pulldown resistor
C_I
Input capacitance
For pullup: V_IN = V_SS;
For pulldown:
V_IN = V_CC
V_IN = V_SS or V_CC
20
35
5
MAX
0.75 x
V_CC
1.65
2.25
0.55 x
V_CC
1.20
1.65
1
1
UNIT
V
V
V
50 kΩ
pF
(1) XIN and XT2IN in bypass mode only.
Inputs (Ports P1 and P2) – Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
t_(int) External interrupt timing
TEST CONDITIONS
V_CC
MIN
Port P1, P2: P1.x to P2.x, External trigger pulse
width to set interrupt flag⁽¹⁾
2.2 V/3 V
20
MAX
UNIT
ns
(1) An external signal sets the interrupt flag every time the minimum interrupt pulse width t_(int) is met. It may be set even with trigger signals
shorter than t_(int).
Leakage Current (Ports P1 Through P6) – Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I_lkg(Px.x)
PARAMETER
High-impedance leakage
current
TEST CONDITIONS
See ⁽¹⁾ and ⁽²⁾
V_CC
MIN
2.2 V/3 V
TYP
±250
MAX UNIT
nA
(1) The leakage current is measured with V_SS or V_CC applied to the corresponding pin(s), unless otherwise noted.
(2) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
disabled.
Standard Inputs - RST/NMI – Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
V_IL Low-level input voltage
V_IH High-level input voltage
TEST CONDITIONS
V_CC
2.2 V/3 V
2.2 V/3 V
MIN
V_SS
0.8 x V_CC
MAX
V_SS + 0.6
V_CC
UNIT
V
V
32
Copyright © 2010–2011, Texas Instruments Incorporated