SI53106 Datasheet, PDF (5/34 Pages) Silicon Laboratories – SIX-OUTPUT PCIE GEN 3 BUFFER/ZERO DELAY BUFFER

Si53106
Table 3. Output Skew, PLL Bandwidth and Peaking
T_A = –40 to 85 °C; supply voltage V_DD = 3.3 V ±5%
Parameter
Test Condition
Min
Typ Max Unit
CLK_IN, DIF[x:0]
Input-to-Output Delay in PLL Mode
Nominal Value^1,2,3,4
–100 –15
100
ps
CLK_IN, DIF[x:0]
Input-to-Output Delay in Bypass Mode
\Nominal Value^2,4,5
2.5
3.6
4.5
ns
CLK_IN, DIF[x:0]
Input-to-Output Delay Variation in PLL mode
Over voltage and temperature^2,4,5
–100
39
100
ps
CLK_IN, DIF[x:0] Input-to-Output Delay Variation in Bypass Mode –250
3.7
250
ps
Over voltage and temperature^2,4,5
DIF[11:0]
PLL Jitter Peaking
PLL Jitter Peaking
Output-to-Output Skew across all 6 Outputs
(Common to Bypass and PLL Mode)^1,2,3,4,5
(HBW_BYPASS_LBW = 0)⁶
(HBW_BYPASS_LBW = 1)⁶
0
20
50
ps
—
0.4
2.0
dB
—
0.1
2.5
dB
PLL Bandwidth
PLL Bandwidth
(HBW_BYPASS_LBW = 0)⁷
(HBW_BYPASS_LBW = 1)⁷
—
0.7
1.4 MHz
—
2
4
MHz
Notes:
1. Measured into fixed 2 pF load cap. Input-to-output skew is measured at the first output edge following the
corresponding input.
2. Measured from differential cross-point to differential cross-point.
3. This parameter is deterministic for a given device.
4. Measured with scope averaging on to find mean value.
5. All Bypass Mode Input-to-Output specs refer to the timing between an input edge and the specific output edge created
by it.
6. Measured as maximum pass band gain. At frequencies within the loop BW, highest point of magnification is called PLL
jitter peaking.
7. Measured at 3 db down or half power point.
Rev. 1.2
5