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HYB514265BJ-400 Datasheet, PDF (6/28 Pages) Siemens Semiconductor Group – 256K x 16-Bit EDO-Dynamic RAM
HYB 5(3)14265BJ(L)-400/-40/-45/-50
256K x 16 EDO-DRAM
Parameter
Average VCC supply current during
hyper page mode (EDO) operation: -400 version
-40 version
-45 version
-50 version
Standby VCC supply current
(RAS = LCAS = UCAS = WE = VCC – 0.2 V)
Standby VCC supply current (L-version only)
(RAS = LCAS = UCAS = WE = VCC – 0.2 V)
Average VCC supply current during
CAS-before-RAS refresh mode: -400 version
-40 version
-45 version
-50 version
Symbol Limit Values
min. max.
ICC4
–
110
90
75
65
ICC5
–
1
ICC5
–
200
ICC6
–
120
120
105
95
Unit Notes
mA 2, 3, 4
mA 1
µA 1
mA 2, 4
DC Characteristics for 314265
TA = 0 to 70 °C; VSS = 0 V; VCC = 3.3 V ± 0.3 V, tT = 2 ns
Parameter
Symbol Limit Values
min.
max.
Unit Test
Condition
Input high voltage
VIH
Input low voltage
VIL
TTL Output high voltage (IOUT = – 2.0 mA)
VOH
TTL Output low voltage (IOUT = 2 mA)
VOL
CMOS Output high voltage (IOUT = – 100 µA) VOH
CMOS Output low voltage (IOUT = 100 µA)
VOL
Input leakage current, any input
II(L)
(0 V < VIN < VCC + 0.3 V, all other inputs = 0 V)
Output leakage current
IO(L)
(DO is disabled, 0 V < VOUT < VCC + 0.3 V)
Average VCC supply current:
ICC1
-45 version
-50 version
2.0
– 0.5
2.4
–
2.4
–
– 10
– 10
–
VCC + 0.5 V 1
0.8
V1
–
V1
0.4
V1
–
V1
0.4
V1
10
µA 1
10
µA 1
105
mA 2, 3, 4
95
Standby VCC supply current
(RAS = LCAS = UCAS = WE = VIH)
ICC2
–
2
mA –
Semiconductor Group
6