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HYB514265BJ-400 Datasheet, PDF (13/28 Pages) Siemens Semiconductor Group – 256K x 16-Bit EDO-Dynamic RAM
HYB 5(3)14265BJ(L)-400/-40/-45/-50
256K x 16 EDO-DRAM
AC Characteristics (cont’d) 5)6)
TA = 0 to 70 ˚C, tT = 2 ns
Parameter
16E
Symbol
Limit Values
Unit Note
-45
-50
min. max. min. max.
Hyper Page Mode (EDO) Read-modify-Write Cycle
Hyper page mode (EDO) read-write cycle time tPRWC 51 –
CAS precharge to WE
tCPWD 41
–
CAS-before-RAS Refresh Cycle
CAS setup time
CAS hold time
RAS to CAS precharge time
Write to RAS precharge time
Write hold time referenced to RAS
tCSR
5
–
tCHR
10
–
tRPC
5
–
tWRP
10
–
tWRH
10
–
CAS-before-RAS Counter Test Cycle
CAS precharge time
tCPT
30 –
Self Refresh Cycle (L-version)
RAS pulse width
RAS precharge
CAS hold time
tRASS
tRPS
tCHS
100k –
110 –
– 50 –
58 –
41 –
10 –
10 –
5
–
10 –
10 –
35 –
100k –
95 –
– 50 –
ns
ns
ns
ns
ns
ns
ns
ns
ns 17
ns 17
ns 17
Notes:
1) All voltages are referenced to VSS.
2) ICC1, ICC3, ICC4 and ICC6 depend on cycle rate.
3) ICC1 and ICC4 depend on output loading. Specified values are obtained with the output open.
4) Address can be changed once or less while RAS = VIL. In case of ICC4 it can be changed once or less during
a hyper page mode (EDO) cycle
5) An initial pause of 200 µs is required after power-up followed by 8 RAS cycles of which at least one cycle has
to be a refresh cycle, before proper device operation is achieved. In case of using the internal refresh counter,
a minimum of 8 CAS-before-RAS initialization cycles instead of 8 RAS cycles are required.
6) AC measurements assume tT = 2 ns.
Semiconductor Group
13