74F841 Datasheet, PDF (10/18 Pages) NXP Semiconductors – Bus interface latches

Philips Semiconductors
Bus interface latches
Product specification
74F841/74F842/74F843/
74F845/74F846
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
V_OL
V_IK
I_I
I_IH
I_IL
I_OZH
High-level output voltage
±10%V_CC 2.2
V
V_CC = MIN,
I_OH = –15mA _±5%VCC
2.2
3.3
V
V_IL = MAX, V_IH = MIN
±10%V_CC 2.0
V
I_OH = –24mA
±5%V_CC 2.0
V
Low-level output voltage
V_CC = MIN,
V_IL = MAX, V_IH = MIN
I_OL = 32mA
I_OL = 48mA
±10%V_CC
±5%V_CC
0.38 0.55 V
0.38 0.55 V
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2 V
Input current at maximum input voltage
V_CC = 0.0V, V_I = 7.0V
100 µA
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
Low-level input current
V_CC = MAX, V_I = 0.5V
–20 µA
Off-state output current,
High-level voltage applied
V_CC = MAX, V_O = 2.7V
50
µA
I_OZL
Off-state output current,
Low-level voltage applied
V_CC = MAX, V_O = 0.5V
–50 µA
I_OS
Short-circuit output current³
V_CC = MAX
–100
–225 mA
I_CCH
50
65
mA
74F841 I_CCL
V_CC = MAX
60
80
mA
I_CCZ
70
92
mA
I_CCH
40
60
mA
74F842 I_CCL
V_CC = MAX
65
90
mA
I_CC
Supply current
(total)
I_CCZ
I_CCH
74F843
74F845
I_CCL
I_CCZ
V_CC = MAX
60
90
mA
65
90
mA
75 100 mA
85 115 mA
I_CCH
50
70
mA
74F846 I_CCL
V_CC = MAX
70
95
mA
I_CCZ
70
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter test, I_OS tests should be performed last.
1999 Jun 23
10