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MT41J64M16JT-125G Datasheet, PDF (60/214 Pages) Micron Technology – DDR3 SDRAM MT41J256M4 – 32 Meg x 4 x 8 banks MT41J128M8 – 16 Meg x 8 x 8 banks MT41J64M16 – 8 Meg x 16 x 8 banks
1Gb: x4, x8, x16 DDR3 SDRAM
ODT Characteristics
Figure 24: ODT Timing Reference Load
CK, CK#
DUT
VREF VDDQ/2
DQ, DM
DQS, DQS#
TDQS, TDQS#
RTT = 25ȍ
VTT = VSSQ
Timing reference point
ZQ
RZQ = 240ȍ
VSSQ
Table 35: ODT Timing Definitions
Symbol
tAON
tAOF
tAONPD
tAOFPD
tADC
Begin Point Definition
End Point Definition
Rising edge of CK - CK# defined by the end Extrapolated point at VSSQ
point of ODTLon
Rising edge of CK - CK# defined by the end Extrapolated point at VRTT,nom
point of ODTLoff
Rising edge of CK - CK# with ODT first being Extrapolated point at VSSQ
registered HIGH
Rising edge of CK - CK# with ODT first being Extrapolated point at VRTT,nom
registered LOW
Rising edge of CK - CK# defined by the end Extrapolated points at VRTT(WR) and
point of ODTLcnw, ODTLcwn4, or ODTLcwn8 VRTT,nom
Figure
Figure 25 (page 61)
Figure 25 (page 61)
Figure 26 (page 61)
Figure 26 (page 61)
Figure 27 (page 62)
Table 36: Reference Settings for ODT Timing Measurements
Measured Parameter
tAON
tAOF
tAONPD
tAOFPD
tADC
RTT,nom Setting
RZQ/4 (60Ω
RZQ/12 (20Ω
RZQ/4 (60Ω
RZQ/12 (20Ω
RZQ/4 (60Ω
RZQ/12 (20Ω
RZQ/4 (60Ω
RZQ/12 (20Ω
RZQ/12 (20Ω
RTT(WR) Setting
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
RZQ/2 (120Ω
VSW1
50mV
100mV
50mV
100mV
50mV
100mV
50mV
100mV
200mV
VSW2
100mV
200mV
100mV
200mV
100mV
200mV
100mV
200mV
300mV
Note: 1. Assume an RZQ of 240Ω (±1%) and that proper ZQ calibration has been performed at a
stable temperature and voltage (VDDQ = VDD, VSSQ = VSS).
PDF: 09005aef826aa906
1Gb_DDR3_SDRAM.pdf - Rev. L 03/13 EN
60
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