ISL12022M_10 Datasheet, PDF (7/31 Pages) Intersil Corporation – Low Power RTC with Battery Backed SRAM,Integrated ±5ppm Temperature Compensation and Auto Daylight Saving

ISL12022M
I²C Interface Specifications
Test Conditions: V_DD = +2.7 to +5.5V, Temperature = -40°C to +85°C,
unless otherwise specified. Boldface limits apply over the operating temperature
range, -40°C to +85°C. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
(Note 7) (Note 8) (Note 7) UNITS NOTES
t_HD:STA
t_SU:DAT
t_HD:DAT
t_SU:STO
t_HD:STO
t_DH
START Condition Hold Time
Input Data Setup Time
Input Data Hold Time
STOP Condition Setup Time
STOP Condition Hold Time
Output Data Hold Time
From SDA falling edge
crossing 30% of V_DD to
SCL falling edge crossing
70% of V_DD.
From SDA exiting the
30% to 70% of V_DD
window, to SCL rising
edge crossing 30% of
V_DD.
From SCL falling edge
crossing 30% of V_DD to
SDA entering the 30% to
70% of V_DD window.
From SCL rising edge
crossing 70% of V_DD, to
SDA rising edge crossing
30% of V_DD.
From SDA rising edge to
SCL falling edge. Both
crossing 70% of V_DD.
From SCL falling edge
crossing 30% of V_DD,
until SDA enters the
30% to 70% of V_DD
window.
600
100
20
600
600
0
ns
ns
900
ns
ns
ns
ns
t_R
SDA and SCL Rise Time
From 30% to 70% of 20 + 0.1 x
V_DD.
Cb
t_F
SDA and SCL Fall Time
From 70% to 30% of 20 + 0.1 x
V_DD.
Cb
Cb
Capacitive Loading of SDA or Total on-chip and
10
SCL
off-chip
300
300
400
ns
13, 14
ns
13, 14
pF
13, 14
R_PU
SDA and SCL Bus Pull-up
Maximum is determined
1
Resistor Off-chip
by t_R and t_F.
For Cb = 400pF, max is
about 2kΩ~2.5kΩ.
For Cb = 40pF, max is
about 15kΩ~20kΩ
kΩ
13, 14
NOTES:
7. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits
established by characterization and are not production tested.
8. Specified at +25°C.
9. Temperature Conversion is inactive below V_BAT = 2.7V. Device operation is not guaranteed at V_BAT <1.8V.
10. IRQ/F_OUT inactive.
11. V_DD > V_BAT +V_BATHYS
12. In order to ensure proper timekeeping, the V_{DD SR-} specification must be followed.
13. Limits should be considered typical and are not production tested.
14. These are I²C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate
specification.
15. Minimum V_DD and/or V_BAT of 1V to sustain the SRAM. The value is based on characterization and it is not tested.
7
FN6668.7
June 4, 2010