TDA5250D2 Datasheet, PDF (79/97 Pages) Infineon Technologies AG – ASK/FSK 868MHz Wireless Transceiver

confidential
TDA 5250 D2
preliminary
Applications
4.10 Sensitivity Measurements
4.10.1 Test Setup
The test setup used for the measurements is shown in the following figure. In
case of ASK modulation the Rohde & Schwarz SMIQ generator, which is a vec-
tor signal generator, is connected to the I/Q modulation source AMIQ. This
"baseband signal generator" is in turn controlled by the PC based software
WinQSIM via a GPIB interface. The AMIQ generator has a pseudo random
binary sequence (PRBS) generator and a bit error test set built in. The resulting
I/Q signals are applied to the SMIQ to generate a ASK (OOK) spectrum at the
desired RF frequency.
Data is demodulated by the TDA5250 and then sent back to the AMIQ to be
compared with the originally sent data. The bit error rate is calculated by the bit
error rate equipment inside the AMIQ.
Baseband coding in the form of Manchester is applied to the I signal as can be
seen in the subsequent figure.
Personal C om puter
S oftware
W inIQSIM
GPIB /
RS 232
M arker Output
Rohde & Schwarz
I/Q M odulation Source
A M IQ
I
Q
C lock
AM IQ BER T
(Bit E rror R ate
Test S et)
D a ta
M anchester
Encoder
M anchester
Decoder
Rohde & Schwarz
V ector S ignal G enerator
SM IQ 03
ASK / FSK R F Signal
Figure 4-36 BER Test Setup
DATAout
R Fin
DUT
Transceiver Testboard
TDA5250
TestSetup.wmf
Wireless Components
4 - 39
Specification, July 2002