TC1791 Datasheet, PDF (145/153 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1791
Electrical ParametersFlash Memory Parameters
Table 43 FLASH32 Parameters (cont’d)
Parameter
Symbol
Values
Unit Note /
Min. Typ. Max.
Test Condition
DFlash wait state
configuration
WS_DF 50 ns x −
−
CC
f_FSI
PFlash wait state
configuration
WS_PF 26 ns x −
−
CC
f_FSI
1) In case of wordline oriented defects (see robust EEPROM emulation in the User's Manual) this erase time can
increase by up to 100%.
2) In case the Program Verify feature detects weak bits, these bits will be programmed up to twice more. Each
reprogramming takes additional 5 ms.
3) In case the Program Verify feature detects weak bits, these bits will be programmed once more. The
reprogramming takes additional 5 ms.
4) Only valid when a robust EEPROM emulation algorithm is used. For more details see the User´s Manual.
5) Storage and inactive time included.
6) At average weighted junction temperature T_j = 100°C, or the retention time at average weighted temperature
of T_j = 110°C is minimum 10 years, or the retention time at average weighted temperature of T_j = 150°C is
minimum 0.7 years.
Data Sheet
138
V 1.1, 2014-05