E1962B Datasheet, PDF (24/26 Pages) Agilent(Hewlett-Packard) – cdma2000/IS-95/AMPS Mobile Test Application

General specifications
Dimensions (H x W x D): 8.75 x 16.75 x 24.63 in
(222 x 426 x 625 mm), 7 rack spaces high
Weight: 66 lbs (30 kg)
Display: 10.5 in (26.7 cm), active matrix, color, liquid crystal
LAN (local area network) port (for firmware upgrades and
protocol logging only): RJ-45 connector, 10 base T Ethernet
with TCP/IP support
Operating temperature: 0 to +55 °C
Storage temperature: −20 to +70 °C
Power: 100 to 240 Vac, 50 to 60 Hz, 550 VA maximum
Calibration interval: 2 years
EMI: conducted and radiated interference meets CISPR-11
Radiated leakage due to RF generator: typically < 1 µV induced in
a resonant dipole antenna one inch from any surface except the
underside and rear panel at a set RF generator output frequency
and output level of −40 dBm
Power consumption: typically 400 to 450 W continuous
Measurement speed: typical measurement speed based on using
at least a 600 MHz Pentium^® II processor PC and with the
display off mode selected on the E5515C; measurement speeds
include the total time from GPIB measurement request until the
controller receives the result using the INT/FETCH commands;
due to variations of trigger latencies and internal test set
processor loading, individual measurement times may be faster
or slower; measurement speeds also vary depending on the
controller GPIB environment and processor speed
Analog measurements
Measurement name
Analog Tx power
Frequency modulation (with
deviation result)
Frequency modulation (with
deviation and distortion
results)
Frequency stability
Audio analyzer (with level
result)
Audio analyzer (with level,
SINAD, and distortion results)
One
measurement
15 ms
134 ms
163 ms
174 ms
65 ms
96 ms
CDMA measurements
Measurement name
Channel power (normal mode)
Channel power (fast mode)
Channel power (very fast
mode)
Average power (RC3)
Dynamic power (20 steps)
Maximum minimum power
Waveform quality IS-95, RC1,
or RC2
Waveform quality IS-2000
RC3/4
Code channel time and phase
error
Handoff waveform quality
Gated power (100
measurements)
Tx spurious response
Time response of open loop
power
One
measurement
73 ms
28 ms
9 ms
(estimate)
199 ms
400 ms
(estimate)
TBD
170 ms
202 ms
299 ms
735 ms
157 ms
338 ms
1210 ms
Five
measurements
41 ms
448 ms
528 ms
754 ms
284 ms
314 ms
Ten
measurements
616 ms
210 ms
34 ms
(estimate)
1773 ms
NA
NA
1001 ms
1385 ms
2326 ms
NA
3352 ms
2566 ms
NA
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