33899 Datasheet, PDF (5/26 Pages) Freescale Semiconductor, Inc – Programmable H-Bridge Power IC

ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
Protected Power Supply Voltage
V_IGNP
- 0.3 to 40
V
Logic Supply Voltage
V_CC
- 0.3 to 7.0
V
Logic Output Bias Voltage
V_DDQ
- 0.3 to 7.0
V
VCCL Supply Voltage
V_CCL
- 0.3 to 5.0
V
Input / Output Voltage (FWD, REV, EN1, EN2, PWM, CS, DI, SCLK, DO, CSNS,
V_{I / O}
- 0.3 to 7.0
V
LSCMP, RS, REDIS)
Motor Outputs
V_S0, V_S1
- 0.5 to 40
V
Charge Pump Voltage
V_CRES
- 0.3 to 50
V
ESD Voltage⁽¹⁾
Human Body Model
Machine Model
V
V_ESD1
V_ESD2
± 1500
± 200
THERMAL RATINGS
Operating Temperature⁽²⁾
Ambient
Junction
Storage Temperature
Thermal Resistance, Junction to Ambient⁽³⁾
Thermal Resistance, Junction to Case (Exposed Pad)
Peak Package Reflow Temperature During Solder Mounting⁽⁴⁾
T_A
T_J
T_STG
R_θJA
R_θJC
T _SOLDER
- 40 to 125
- 40 to 150
- 65 to 150
18
<0.5
220
°C
°C
°C/W
°C/W
°C
Notes
1. ESD1 testing is performed in accordance with the Human Body Model (C_ZAP = 100pF, R_ZAP = 1500Ω), ESD2 testing is performed in
accordance with the Machine Model (C_ZAP = 200pF, R_ZAP = 0Ω).
2. The junction temperature is the primary limiting parameter. The module thermal design must provide a low enough thermal impedance
to keep the junction temperature within limits for all anticipated power levels and ambient temperatures.
3. R_θJA is referenced to the JEDEC standard 2s2p thermal evaluation board at 1W total device power dissipation in still air. Deviations from
this standard will produce corresponding changes in the actual thermal performance.
4. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33899
5