S9S08SG8E2MTJ Datasheet, PDF (303/320 Pages) Freescale Semiconductor, Inc – MC9S08SG8 MC9S08SG4 Data Sheet Addendum

Appendix A Electrical Characteristics
A.9 Internal Clock Source (ICS) Characteristics
Table A-9. ICS Frequency Specifications (Temperature Range = –40 to 125C Ambient)
Nu
m
C
Rating
Temp Rated¹
Symbol
Min
Typ
Max
Unit
Standard
AEC
Grade 0
Internal reference frequency - factory
1 P trimmed
at V_DD = 5 V
f_{int_ft}
— 31.25 — kHz
x
x
Internal reference frequency -
2 P _untrimmed2
f_{int_ut}
25
36 41.66 kHz
x
x
3
P
Internal reference frequency - user
trimmed
f_{int_t}
31.25 — 39.0625 kHz
x
x
4 D Internal reference startup time
t_irefst
—
55
100 s
x
x
DCO output frequency range -
5
—
untrimmed¹ 
value provided for reference: f_{dco_ut} =
f_{dco_ut}
25.6 36.86 42.66 MHz
x
x
1024  f_{int_ut}
6
D
DCO output frequency range -
trimmed
32
—
40 MHz
x
f_{dco_t}
32
—
36 MHz
x
Resolution of trimmed DCO output
7 D frequency at fixed voltage and
f_{dco_res_t}
—
0.1 0.2 %f_dco
x
x
temperature (using FTRIM)
Resolution of trimmed DCO output
8 D frequency at fixed voltage and
f_{dco_res_t}
—
0.2 0.4 %f_dco
x
x
temperature (not using FTRIM)
Total deviation from actual trimmed
9 P DCO output frequency over voltage
and temperature
f_{dco_t}
—
+ 0.5
– 1.0
1.5 %f_dco
x
—
+ 0.5
– 1.0
3 %f_dco
x
Total deviation of trimmed DCO output
10 D frequency over fixed voltage and
f_{dco_t}
—
0.5 1 %f_dco
x
x
temperature range of 0C to 70 C
11 D _{FLL acquisition time} ³
t_acquire
1
ms
x
x
DCO output clock long term jitter (over
12 D _{2mS interval) 4}
C_Jitter
—
0.02
0.2 %f_dco
x
x
1 _{Electrical characteristics only apply to the temperature rated devices marked with x.}
2 _{TRIM register at default value (0x80) and FTRIM control bit at default value (0x0).}
3 _{This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or}
changing from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used
as the reference, this specification assumes it is already running.
4 _{Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fBUS.}
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal.
Noise injected into the FLL circuitry via V_DD and V_SS and variation in crystal oscillator frequency increase the C_Jitter
percentage for a given interval.
MC9S08SG8 MCU Series Data Sheet, Rev. 7
Freescale Semiconductor
299