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PXN20 Datasheet, PDF (27/60 Pages) Freescale Semiconductor, Inc – PXN20 Microcontroller
Electrical characteristics
8 VDDEx are separate power segments and may be powered independently with no differential voltage constraints between the
power segments.
9 AC signal over and undershoot of the input voltages of up to ±2.0 V is permitted for a cumulative duration of 60 hours over the
complete lifetime of the device (injection current does not need to be limited for this duration).
10 Internal structures will hold the input voltage above –1.0 V if the injection current limit of 2 mA is met.
11 Internal structures hold the input voltage below this maximum voltage on all pads powered by VDDE supplies, if the maximum
injection current specification is met (25 mA for all pins) and VDDE is within Operating Voltage specifications.
12 Total injection current for all pins (including both digital and analog) must not exceed 25 mA.
13 Total injection current for all analog input pins must not exceed 15 mA.
14 Solder profile per CDF-AEC-Q100.
15 Moisture sensitivity per JEDEC test method A112.
4.2 Thermal characteristics
Table 6. Thermal characteristics
Spec
Characteristic
Symbol Unit
Value
208 MAPBGA 256 MAPBGA
1 Junction to Ambient1, 2
Natural Convection
(Single layer board)
RJA
°C/W
39
39
2 Junction to Ambient1, 3
Natural Convection
(Four layer board 2s2p)
RJA
°C/W
24
24
3 Junction to Ambient1, 3
(@200 ft./min., Single layer board)
RJMA °C/W
31
31
4 Junction to Ambient1, 3
RJMA °C/W
20
20
(@200 ft./min., Four layer board 2s2p)
5 Junction to Board4
6 Junction to Case5
7 Junction to Package Top6
Natural Convection
RJB
°C/W
13
13
RJC
°C/W
6
6
JT
°C/W
2
2
1 Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3 Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5 Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature.
6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2.
4.2.1 General notes for specifications at maximum junction temperature
An estimation of the chip junction temperature, TJ, can be obtained from the equation:
TJ = TA + (RJA  PD)
Eqn. 1
PXN20 Microcontroller Data Sheet, Rev. 1
Freescale Semiconductor
27