33910 Datasheet, PDF (16/44 Pages) Freescale Semiconductor, Inc – LIN System Basis Chip with 2x60mA High Side Drivers

ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
33910
LIN
PGND LGND AGND
1.0nF
TRANSIENT PULSE
GENERATOR
(NOTE)
GND
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 4. Test Circuit for Transient Test Pulses (LIN)
33910
1.0nF
L1
10kΩ
PGND LGND AGND
TRANSIENT PULSE
GENERATOR
(NOTE)
GND
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.
Figure 5. Test Circuit for Transient Test Pulses (L1)
V_SUP
TXD
RXD
R0
LIN
R0 AND C0 COMBINATIONS:
• 1.0KΩ and 1.0nF
C0
• 660Ω and 6.8nF
• 500Ω and 10nF
33910
16
Figure 6. Test Circuit for LIN Timing Measurements
Analog Integrated Circuit Device Data
Freescale Semiconductor