K11P121M50SF4 Datasheet, PDF (13/59 Pages) Freescale Semiconductor, Inc – K11 Sub-Family Data Sheet

Table 4. Voltage and current operating behaviors (continued)
Symbol
V_OL
I_OLT
I_IN
Description
Output low voltage — high drive strength
• 2.7 V ≤ V_DD ≤ 3.6 V, I_OL = 9 mA
• 1.71 V ≤ V_DD ≤ 2.7 V, I_OL = 3 mA
Output low voltage — low drive strength
• 2.7 V ≤ V_DD ≤ 3.6 V, I_OL = 2 mA
• 1.71 V ≤ V_DD ≤ 2.7 V, I_OL = 0.6 mA
Output low current total for all ports
Input leakage current (per pin)
• @ full temperature range
• @ 25 °C
Min.
Max.
Unit
—
0.5
V
—
0.5
V
—
0.5
V
—
0.5
V
—
100
mA
—
1.0
μA
—
0.1
μA
I_OZ
Hi-Z (off-state) leakage current (per pin)
—
1
μA
I_OZ
Total Hi-Z (off-state) leakage current (all input pins)
—
4
μA
R_PU
Internal pullup resistors
22
50
kΩ
R_PD
Internal pulldown resistors
22
50
kΩ
1. Tested by ganged leakage method
2. Measured at Vinput = V_SS
3. Measured at Vinput = V_DD
General
Notes
1
2
3
5.2.4 Power mode transition operating behaviors
All specifications except t_POR, and VLLSx→RUN recovery times in the following table
assume this clock configuration:
• CPU and system clocks = 50 MHz
• Bus clock = 50 MHz
• Flash clock = 25 MHz
Table 5. Power mode transition operating behaviors
Symbol
t_POR
Description
After a POR event, amount of time from the point V_DD
reaches 1.71 V to execution of the first instruction
across the operating temperature range of the chip.
• VLLS0 → RUN
Min.
—
—
Max.
300
130
Unit
Notes
μs
μs
• VLLS1 → RUN
—
130
μs
• VLLS2 → RUN
—
70
μs
Table continues on the next page...
K11 Sub-Family Data Sheet Data Sheet, Rev. 3, 08/2012.
Freescale Semiconductor, Inc.
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