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XR88C681CP Datasheet, PDF (10/99 Pages) Exar Corporation – CMOS DUAL CHANNEL UART (DUART)
XR88C681
AC ELECTRICAL CHARACTERISTICS 1, 2, 3 (CONT’D)
Test Conditions:  J   >" ; J 6;  6K   %%  (% % '(+( $
Symbol
Parameter
Min. Typ. Max. Unit Conditions
Clock Timing (Figure 56) (Cont’d.)

  .(  2!   '3

8(-  9 ( #,

  .(  2!   '3

 E '&
5
5  $ 5 2!   8(-
 9 ( =

+5
5  $ 5 2!  
 E '&
/5

5

Transmitter Timing (Figure 57)
>1>
%
8I
%
/
8I

8I
5
5   &  5
2!   9

5   &  5
#     9
5
5    (  5
<
2!   8(-
58
5  8$ ( + 5

2!   8(-
16
%
6
%
%
%
Notes
1.Parameters are valid over the specified temperature and operating supply ranges. Typical values are 25C, VCC = 5V and typical
processing parameters.
2.All voltages are referenced to ground (GND). For testing, input signal levels are 0.4V and 2.4V with a transition time of 20ns
maximum. All time measurements are referenced at input voltages of 0.8V and 2.0V as appropriate. See Figure 50.
3.AC test conditions for outputs: CL = 50pF, RL = 2.7k• to VCC.
4.If CS is used as the strobing input, this parameter defines the minimum high time between CSs.
5.Consecutive write operations to the same register require at least three edges of the X1 clock between writes.
6.This specification imposes a 6 MHz maximum 68000 clock frequency if a read or write cycle follows immediately after the previous
read or write cycle. A higher 68000 clock can be used if this is not the case.
7.This specification imposes a lower bound on CS and IACK low, guaranteeing that they will be low for at least one CLK period.
8.The minimum high time must be at least 1.5 times the X1/CLK period and the minimum low time must be at least equal to the X1/CLK
period if either channel’s Receiver is operating in external 1X clock mode.
Specifications are subject to change without notice
ABSOLUTE MAXIMUM RATINGS1
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1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rat-
ing only, and functional operation of the device at these or any other conditions above those indicated in the “Electrical Characteris-
tics” section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.