SDA9401 Datasheet, PDF (25/69 Pages) List of Unclassifed Manufacturers – Scan Rate Converter using Embedded DRAM Technology Units

SDA 9401
Parameter
TNRFIY/C
1: off
0: on
TNRVAY/C
TNRHOY/C
TNRKOY/C
TNRCLY/C
Subaddress
Description
21h/22h
Switch for fixed K-factor value defined by TNRVAY/C
20h
21h/22h
1Fh
1Eh
Fixed K-factor for temporal noise reduction of lumi-
nance/chrominance
Horizontal shift of the motion detector characteristic
Vertical shift of the motion detector characteristic
Classification of temporal noise reduction
6.3.5 Noise measurement
The noise measurement algorithm can be used to change the parameters of the temporal noise
reduction processing depending on the actual noise level of the input signal. This is done by the I²C-
bus controller which reads the NOISEME value, and sends depending on this value different
parameter sets to the temporal noise reduction registers of the SDA 9401. The NOISEME value can
be interpreted as a linear curve from no noise (0) to strong noise (30). Value 31 indicates an
overflow status and can be handled in different ways: strong noise or measurement failed.
Two measurement algorithms are included, which can be chosen by the parameter NMALG. In case
NMALG=1 the noise is measured during the vertical blanking period in the line defined by NMLINE.
For NMALG=0 the noise is measured during the first active line. In both cases the value is
determined by averaging over several fields.
The figure below shows an example for the noise measurement. The NMLINE parameter
determines the line, which is used in the SDA 9401 for the measurement. In case of VINDEL=0 and
NMLINE=0 line 3 of the field A and line 316 of the field B is chosen. In case of VINDEL=0 and
NMLINE=3 line 6 of the field A and line 319 of the field B is chosen.
Micronas
25
Preliminary Data Sheet