PSOC4200M Datasheet, PDF (27/42 Pages) Cypress Semiconductor – Programmable System-on-Chip

PSoC^® 4: PSoC 4200M Family
Datasheet
Table 24. Fixed SPI Master mode AC Specifications
(Guaranteed by Characterization)
Spec ID
Parameter
Description
Min Typ Max Units Details/Conditions
SID167
T_DMO
MOSI valid after Sclock driving
–
–
15
ns
edge
SID168
T_DSI
MISO valid before Sclock
20
–
capturing edge. Full clock, late
MISO Sampling used
–
ns
SID169
T_HMO
Previous MOSI data hold time
0
–
with respect to capturing edge at
Slave
–
ns
Table 25. Fixed SPI Slave mode AC Specifications
(Guaranteed by Characterization)
Spec ID
SID170
SID171
SID171A
SID172
SID172A
Parameter
T_DMI
T_DSO
T_{DSO_ext}
T_HSO
T_SSELSCK
Description
MOSI valid before Sclock
capturing edge
MISO valid after Sclock driving
edge
MISO valid after Sclock driving
edge in Ext. Clock mode
Previous MISO data hold time
SSEL Valid to first SCK Valid
edge
Min Typ
40
–
Max
–
Units
ns
Details/Conditions
–
– 42 + 3 × ns
(1/FCPU)
–
–
48
ns
0
–
–
ns
100 –
–
ns
Memory
Table 26. Flash DC Specifications
Spec ID
SID173
Parameter
V_PE
Description
Erase and program voltage
Min Typ
1.71
–
Table 27. Flash AC Specifications
Spec ID
Parameter
Description
Min Typ
SID174
T_ROWWRITE
Row (block) write time (erase and –
–
program)
SID175
T_ROWERASE
Row erase time
–
–
SID176
T_ROWPROGRAM Row program time after erase
–
–
SID178
T_BULKERASE
Bulk erase time (128 KB)
–
–
SID179
T_SECTORERASE Sector erase time (8 KB)
–
–
SID180
T_DEVPROG
Total device program time
–
–
SID181
F_END
Flash endurance
100 K –
SID182
SID182A
F_RET
SID182B F_RETQ
Flash retention. T_A  55 °C, 100 K 20
–
P/E cycles
Flash retention. T_A  85 °C, 10 K 10
–
P/E cycles
Flash retention. T_A  105 °C, 10K 10
20
P/E cycles,  three years at T_A ≥
85 °C
Max Units Details/Conditions
5.5
V
Max Units Details/Conditions
20
ms Row (block) = 128 bytes
13
ms
7
ms
35
ms
15
ms
15 seconds Guaranteed by charac-
terization
–
cycles Guaranteed by charac-
terization
–
years Guaranteed by charac-
terization
–
years Guaranteed by charac-
terization
–
years Guaranteed by charac-
terization.
Document Number: 001-93963 Rev. *G
Page 27 of 42