EX128-PTQG100 Datasheet, PDF (45/49 Pages) Actel Corporation – eX Family FPGAs

Datasheet Information
eX Family FPGAs
List of Changes
The following table lists critical changes that were made in the current version of the document.
Previous version Changes in current version (v4.3)
Page
v4.2
(June 2004)
The "Ordering Information" was updated with RoHS information. The TQFP measurement ii
was also updated.
The "Dedicated Test Mode" was updated.
1-9
Note 5 was added to the "3.3V LVTTL Electrical Specifications" and "5.0V TTL Electrical 1-15
Specifications" tables
The "LP Low Power Pin" description was updated.
1-26
v4.1
The "eX Timing Model" was updated.
1-18
v4.0
The "Development Tool Support" section was updated.
1-12
The "Package Thermal Characteristics" section was updated.
1-17
v3.0
The "Product Profile" section was updated.
1-i
The "Ordering Information" section was updated.
1-ii
The "Temperature Grade Offerings" section is new.
1-ii
The "Speed Grade and Temperature Grade Matrix" section is new.
1-ii
The "General Description" section was updated.
1-1
The "Clock Resources" section was updated.
1-4
Table 1-1 • Connections of Routed Clock Networks, CLKA and CLKB is new.
1-4
The "User Security" section was updated.
1-5
The "I/O Modules" section was updated.
1-5
The "Hot Swapping" section was updated.
1-6
The "Power Requirements" section was updated.
1-6
The "Low Power Mode" section was updated.
1-6
The "Boundary Scan Testing (BST)" section was updated.
1-9
The "Dedicated Test Mode" section was updated.
1-9
The "Flexible Mode" section was updated.
1-9
Table 1-5 • Boundary-Scan Pin Configurations and Functions is new.
1-9
The "TRST Pin" section was updated.
1-9
The "Probing Capabilities" section is new.
1-10
The "Programming" section was updated.
1-10
The "Probing Capabilities" section was updated.
1-10
The "Silicon Explorer II Probe" section was updated.
1-10
The "Design Considerations" section was updated.
1-11
The "Development Tool Support" section was updated.
1-12
The "Absolute Maximum Ratings*" section was updated.
1-13
The "Temperature and Voltage Derating Factors" section was updated.
1-21
The "TDI, I/O Test Data Input" section was updated.
1-26
v4.3
3-1