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W949D6DB Datasheet, PDF (56/60 Pages) Winbond – Standard Self Refresh Mode
W949D6DB / W949D2DB
11. tQH = tHP - tQHS, where tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCL,
tCH). tQHS accounts for 1) the pulse duration distortion of on-chip clock circuits; and 2) the worst case push-out of DQS on
one transition followed by the worst case pull-in of DQ on the next transition, both of which are, separately, due to data pin
skew and output pattern effects, and p-channel to n-channel variation of the output drivers.
12. The only time that the clock frequency is allowed to change is during clock stop, power-down or self-refresh modes.
13. The transition time for DQ, DM and DQS inputs is measured between VIL(DC) to VIH(AC) for rising input signals, and VIH(DC)
to VIL(AC) for falling input signals.
14. DQS, DM and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal
transitions through the DC region must be monotonic.
15. Input slew rate ≥ 1.0 V/nS.
16. Input slew rate ≥ 0.5 V/nS and < 1.0 V/nS.
17. These parameters guarantee device timing but they are not necessarily tested on each device.
18. The transition time for address and command inputs is measured between VIH and VIL.
19. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
20. tDQSQ consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers for any
given cycle.
21. The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before the corresponding
CK edge. A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no
writes were previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in
progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS.
22. The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but
system performance (bus turnaround) will degrade accordingly.
23. A low level on DQS may be maintained during High-Z states (DQS drivers disabled) by adding a weak pull-down element in
the system. It is recommended to turn off the weak pull-down element during read and write bursts (DQS drivers enabled).
24. At least one clock cycle is required during tWR time when in auto precharge mode.
25. tDAL = (tWR/tCK) + (tRP/tCK): for each of the terms, if not already an integer, round to the next higher integer.
26. There must be at least two clock pulses during the tXSR period.
27. There must be at least one clock pulse during the tXP period.
28. tREFI values are dependent on density and bus width.
29. A maximum of 8 Refresh commands can be posted to any given LPDDR, meaning that the maximum absolute interval
between any Refresh command and the next Refresh command is 8*tREFI.
9.5.1 CAS Latency Definition (With CL = 3)
T0
T1
T2 T2n T3 T3n T4 T4n T5 T5n T6
CK
CK
Command
DQS
All DQ,
collectively
READ
NOP
NOP
CL=3
tDQSCKmin
tRPRE
NOP
NOP
tDQSCKmin
NOP
NOP
tRPST
tLZmin
tLZmin
T2 T2n
T3
T3n
T4
T4n
T5
T5n
1) DQ transitioning after DQS transition define tDQSQ window.
2) ALL DQ must transition by tDQSQ after DQS transitions, regardless of tAC
3) tAC is the DQ output window relative to CK,and is the long term component of DQ skew.
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Publication Release Date: Oct. 08, 2014
Revision: A01-003