TA1316AN Datasheet, PDF (99/115 Pages) Toshiba Semiconductor – YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV

TA1316AN
Note
Parameter
No.
T33 OSD ACL
characteristic
SW3
A
SW4
B
SW5
B
Test Conditions
SW mode
Test Method (test conditions: V_CC = 9 V/2 V, Ta = 25° ± 3°C)
SW33 SW34 SW35 SW37 SW38 SW39
A
A
A
A
A
B (1) Set sub-address (07) data to 01.
(2) Apply 5 V from external power supply to pins 50 and 51.
(3) Input signal 1 (f₀ = 100 kHz, picture period amplitude = 0.2 V_P-P) to pin 39.
(4) Measure picture period amplitude vOSDACL1 on pin 43.
(5) Apply external power supply (pin 53 DC voltage − 0.5 V) to pin 53 and measure picture
period amplitude vOSDACL2 on pin 43.
(6) Apply external power supply (pin 53 DC voltage − 1 V) to pin 53 and measure picture period
amplitude vOSDACL3 on pin 43.
(7) OSDACL₁ = −20 × "og (vOSDACL2/vOSDACL1)
OSDACL₂ = −20 × "og (vOSDACL3/vOSDACL1)
(8) Repeat steps (5) and (6) above, changing sub-address (07) data to 00, and measure
OSDACL3 and OSDACL4.
99
2002-10-04