TA1316AN Datasheet, PDF (55/115 Pages) Toshiba Semiconductor – YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV

Note No.
Parameter
P03 Black stretch start point 1
TA1316AN
Test Conditions
SW mode
SW1 SW2 SW3 SW56
Test Method (test conditions: V_CC = 9 V/2 V, Ta = 25° ± 3°C)
B
A
C OPEN (1) Set SW2 to A (maximum gain) and black stretch start point 1 to off (000).
(2) Connect external power supply (PS) to pin 3, increase voltage from V₃, and plot resulting pin 56 voltage
change S1. Define pin 56 voltages when V₃ and V₃ + 0.7 V are applied as V₀ and V₁₀₀.
(3) Set black stretch start point 1 to 001 (minimum), increase PS voltage from V₃ as in (2) above and plot
resulting pin 56 voltage change S2.
(4) Set black stretch start point 1 to maximum (111), repeat step (2) above and plot resulting pin 56 voltage
change S3.
(5) Determine S1 and S2 intersection V_BST1 and S1 and S3 intersection V_BST2 using the graph below. Calculate
P_BST1 and P_BST2 using the following formulae.
V_Z [V] = V₁₀₀ [V] − V₀ [V]
P_BST1 [(IRE)] = [(V_BST1 [V] − V₅₆ [V]) ÷ V_Z] × 100 (IRE)
P_BST2 [(IRE)] = [(V_BST2 [V] − V₅₆ [V]) ÷ V_Z] × 100 (IRE)
Pin 56
S3
V_BST2
S1
V_BST1
V₅₆
S2
Pin 3
55
2002-10-04