TA1316AN Datasheet, PDF (57/115 Pages) Toshiba Semiconductor – YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV

Note No.
Parameter
P05 Dynamic ABL detection voltage
TA1316AN
Test Conditions
SW mode
SW1 SW2 SW3 SW56
Test Method (test conditions: V_CC = 9 V/2 V, Ta = 25° ± 3°C)
B
A
C OPEN (1) Set ABL GAIN to minimum (000), DYNAMIC ABL GAIN to maximum (111) and black stretch point 1 to off
(000).
(2) Connect external power supply (PS) to pin 53 and decrease voltage from 6.5 V.
(3) When DYNAMIC ABL POINT bus data is 000, 001, 110 and 100, repeat step (2) above. When pin 56 picture
period goes Low, measure PS voltages V₀₀₀, V₀₀₁, V₀₁₀ and V₁₀₀.
(4) Determine voltage differential between V₀₀₀ and V₀₀₁ (∆V₀₀₁), between V₀₀₀ and V₀₁₀ (∆V₀₁₀), and between
V₀₀₀ and V₁₀₀ (∆V₁₀₀).
DV_*** = V₀₀₀ − V₀₀₁ (V₀₁₀, V₁₀₀)
Pin 56 undetected
Pin 56 detected
Pin 2 waveform
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2002-10-04