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MSP430FR5994 Datasheet, PDF (61/166 Pages) Texas Instruments – Mixed-Signal Microcontrollers
www.ti.com
MSP430FR5994, MSP430FR59941, MSP430FR5992, MSP430FR5964, MSP430FR5962
SLASE54 – MARCH 2016
COMP_E (continued)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
CEON = 0 → 1, VIN+ and VIN– from pins,
Overdrive ≥ 20 mV, CEPWRMD = 00
VCC
MIN TYP
0.9
tEN_CMP
Comparator enable
time
CEON = 0 → 1, VIN+ and VIN– from pins,
Overdrive ≥ 20 mV, CEPWRMD = 01
0.9
CEON = 0 → 1, VIN+ and VIN– from pins,
Overdrive ≥ 20 mV, CEPWRMD = 10
15
tEN_CMP_VREF
Comparator and
reference ladder and
reference voltage
enable time
CEON = 0 → 1, CEREFLX = 10,
CERSx = 10 or 11,
CEREF0 = CEREF1 = 0x0F, REFON = 0
120
tEN_CMP_RL
Comparator and
reference ladder
enable time
CEON = 0 → 1, CEREFLX = 10, CERSx = 10,
REFON = 1, CEREF0 = CEREF1 = 0x0F,
10
VCE_REF
Reference voltage for a VIN = reference into resistor ladder,
given tap
n = 0 to 31
VIN ×
(n +
0.5)
/ 32
VIN ×
(n + 1)
/ 32
MAX UNIT
1.5
1.5 µs
65
220 µs
30 µs
VIN ×
(n +
1.5)
V
/ 32
5.11.12 FRAM
FRAM is a nonvolatile memory that reads and writes like standard SRAM. The FRAM can be read in a
similar fashion to SRAM and needs no special requirements. Similarly, any writes to unprotected
segments can be written in the same fashion as SRAM. Table 5-32 lists the operating characteristics of
the FRAM.
Table 5-32. FRAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
Read and write endurance
TEST CONDITIONS
MIN
1015
TYP MAX UNIT
cycles
tRetention Data retention duration
IWRITE
IERASE
tWRITE
Current to write into FRAM
Erase current
Write time
tREAD Read time
TJ = 25°C
TJ = 70°C
TJ = 85°C
NWAITSx = 0
NWAITSx = 1
100
40
10
IREAD (1)
N/A (2)
tREAD (3)
1 / fSYSTEM (4)
2 / fSYSTEM (4)
years
nA
nA
ns
ns
ns
(1) Writing to FRAM does not require a setup sequence or additional power when compared to reading from FRAM. The FRAM read
current IREAD is included in the active mode current consumption IAM,FRAM.
(2) N/A = not applicable. FRAM does not require a special erase sequence.
(3) Writing into FRAM is as fast as reading.
(4) The maximum read (and write) speed is specified by fSYSTEM using the appropriate wait state settings (NWAITSx).
Copyright © 2016, Texas Instruments Incorporated
Specifications
61
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