MSP430G2333-Q1 Datasheet, PDF (37/62 Pages) Texas Instruments – Automotive Mixed-Signal Microcontroller

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MSP430G2333-Q1
SLAS802A – OCTOBER 2013 – REVISED MARCH 2014
9.34 RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V_(RAMh)
PARAMETER
RAM retention supply voltage ⁽¹⁾
TEST CONDITIONS
CPU halted
MIN MAX UNIT
1.6
V
(1) This parameter defines the minimum supply voltage V_CC when the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
9.35 JTAG and Spy-Bi-Wire Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
f_SBW
t_SBW,Low
t_SBW,En
PARAMETER
Spy-Bi-Wire input frequency
Spy-Bi-Wire low clock pulse length
Spy-Bi-Wire enable time
(TEST high to acceptance of first clock edge⁽¹⁾)
TEST CONDITIONS
V_CC
2.2 V
2.2 V
2.2 V
MIN
0
0.025
TYP MAX
20
15
1
UNIT
MHz
µs
µs
t_SBW,Ret
f_TCK
R_Internal
Spy-Bi-Wire return to normal operation time
TCK input frequency⁽²⁾
Internal pulldown resistance on TEST
2.2 V
2.2 V
2.2 V
15
100 µs
0
5 MHz
25
60
90 kΩ
(1) Tools accessing the Spy-Bi-Wire interface need to wait for the maximum t_SBW,En time after pulling the TEST/SBWCLK pin high before
applying the first SBWCLK clock edge.
(2) f_TCK may be restricted to meet the timing requirements of the module selected.
9.36 JTAG Fuse⁽¹⁾
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
V_CC(FB)
Supply voltage during fuse-blow condition
T_A = 25°C
2.5
V_FB
Voltage level on TEST for fuse blow
6
I_FB
Supply current into TEST during fuse blow
t_FB
Time to blow fuse
MAX
7
100
1
UNIT
V
V
mA
ms
(1) Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to
bypass mode.
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