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SI53313 Datasheet, PDF (7/33 Pages) Silicon Laboratories – DUAL 1:5 LOW-JITTER, ANY-FORMAT BUFFER/LEVEL TRANSLATOR
Si53313
Table 10. AC Characteristics (Continued)
(VDD = VDDOX = 1.8 V 5%, 2.5 V  5%, or 3.3 V 10%,TA = –40 to 85 °C)
Parameter
Minimum Input Pulse
Width
Propagation Delay
Symbol
Test Condition
Min
TW
360
TPLH,
TPHL
LVCMOS (12mA drive with no load)
LVPECL
1250
600
Typ
—
2000
800
Max
—
2750
1000
Unit
ps
ps
ps
LVDS
600
800 1000
ps
Output Enable Time
TEN
F = 1 MHz
F = 100 MHz
F = 725 MHz
—
2500
—
ns
—
30
—
ns
—
5
—
ns
Output Disable Time
TDIS
F = 1 MHz
F = 100 MHz
—
2000
—
ns
—
30
—
ns
Output to Output Skew5
F = 725 MHz
—
TSK
LVCMOS (12 mA drive to no load)
—
LVPECL
—
5
—
ns
50
120
ps
35
70
ps
Part to Part Skew6
Power Supply Noise
Rejection7
TPS
PSRR
LVDS
Differential
10 kHz sinusoidal noise
100 kHz sinusoidal noise
—
35
70
ps
—
—
150
ps
—
–63
—
dBc
—
–62
—
dBc
500 kHz sinusoidal noise
—
–58
—
dBc
1 MHz sinusoidal noise
—
–55
—
dBc
Notes:
1. Slew rate should be >30 mV/ns.
2. 50% input duty cycle.
3. When using the on-chip clock divider, a minimum input clock slew rate of 30 mV/ns is required.
4. HCSL measurements were made with receiver termination. See Figure 9 on page 17.
5. Output to Output skew specified for outputs with an identical configuration.
6. Defined as skew between any output on different devices operating at the same supply voltage, temperature, and
equal load condition. Using the same type of inputs on each device, the outputs are measured at the differential cross
points.
7. Measured for 156.25 MHz carrier frequency. Sine-wave noise added to VDDOX (3.3 V = 100 mVPP) and noise spur
amplitude measured. See “AN491: Power Supply Rejection for Low-Jitter Clocks” for further details.
Rev. 1.0
7