SI5355 Datasheet, PDF (6/22 Pages) Silicon Laboratories – ANY-FREQUENCY 1–200 MHZ QUAD FREQUENCY 8-OUTPUT CLOCK GENERATOR

Si5355
Table 4. Crystal Specifications
Parameter
Symbol
Test Condition Min
Typ
Max
Units
Crystal Frequency
F_XTAL
Option 1
—
25
—
MHz
Option 2
—
27
—
MHz
Load Capacitance (on-chip
differential)
Crystal Output Capacitance
Equivalent Series Resis-
tance
c_L (supported)*
c_L (recommended)
C_O
ESR
25 MHz
27 MHz
11
12
13
pF
17
18
19
pF
—
—
5
pF
—
—
100

—
—
75

Crystal Drive Level Rating
d_L
100
—
—
µW
*Note: See "AN360: Crystal Selection Guide for Si533x and Si5355/56 Devices" for how to accommodate a 12 pF crystal C_L.
Table 5. Thermal Conditions
Parameter
Thermal Resistance Junction to Ambient
Thermal Resistance Junction to Case
Symbol
_JA
_JC
Test Condition
Still Air
Still Air
Value
37
25
Units
o_C/W
o_C/W
Table 6. Absolute Maximum Ratings^1,2,3,4
Parameter
Supply Voltage Range
Input Voltage Range (all pins except pins 1,2,5,6)
Input Voltage Range (pins 1,2,5,6)
Output Voltage Range
Junction Temperature
ESD Tolerance
Symbol
V_DD
V_I
V_I2
V_O
T_J
HBM
CDM
Rating
–0.5 to 3.8
–0.5 to 3.8
–0.5 to 1.3
–0.5 to (V_DD + 0.3)
–55 to +150
2.5
550
Units
V
V
V
V
o_C
kV
V
Latch-up Tolerance
Soldering Temperature (Pb-free profile)⁵
Soldering Temperature
(Pb-free profile)⁵
Time
at
T_PEAK
MM
LU
T_PEAK
T_P
175
V
JESD78 Compliant
260
o_C
20–40
sec
Notes:
1. Permanent device damage may occur if the Absolute Maximum Ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to maximum rating
conditions for extended periods may affect device reliability.
2. 24-QFN package is RoHS compliant.
3. For more packaging information, go to www.silabs.com/support/quality/pages/RoHSInformation.aspx.
4. Moisture sensitivity level is MSL3.
5. The device is compliant with JEDEC J-STD-020.
6
Rev. 1.1