S-1701 Datasheet, PDF (20/70 Pages) Seiko Instruments Inc – HIGH RIPPLE-REJECTION LOW DROPOUT CMOS VOLTAGE REGULATOR WITH RESET FUNCTION

HIGH RIPPLE-REJECTION LOW DROPOUT CMOS VOLTAGE REGULATOR WITH RESET FUNCTION
S-1701 Series
Rev.2.4_00
Detector block
Parameter
Symbol
Table 25 (2/2)
Conditions
(Ta = 25 °C unless otherwise specified)
Min.
Typ.
Max.
Unit
Test
Circuit
Detection voltage^*5 −V_DET
−
−V_DET(S)
× 0.99
−V_DET(S)
−V_DET(S)
× 1.01
V
6
Hysteresis width V_HYS
−
3
5
7
%
6
Output current
I_DOUT
Nch, V_DOUT = 0.5 V V_IN = 1.4 V
(1.5 V ≤ −V_DET(S) ≤ 5.5 V)
1.0
3.0
V_IN = 2.0 V
(2.1 V ≤ −V_DET(S) ≤ 5.5 V)
2.0
4.5
V_IN = 3.0 V
(3.1 V ≤ −V_DET(S) ≤ 5.5 V)
3.0
5.5
−
mA 7
−
mA 7
−
mA 7
V_IN = 4.0 V
(4.1 V ≤ −V_DET(S) ≤ 5.5 V)
4.0
6.0
V_IN = 5.0 V
(5.1 V ≤ −V_DET(S) ≤ 5.5 V)
5.0
6.5
−
mA 7
−
mA 7
Detection voltage
temperature
coefficient^*6
∆−V_DET
−40 ≤ Ta ≤ +85 °C^*8
∆Ta • −V_DET
−
±140
±550
ppm/
°C
6
Delay time
t_D
Current
consumption
I_SSD
during operation
No delay (t_D = 60 µs)
t_D = 50 ms
t_D = 100 ms
V_IN = V_OUT(S) + 1.0 V, ON/OFF pin = OFF,
no load
−
60
100 µs
6
t_D
t_D
t_D
ms
6
× 0.65
× 1.35 ms
6
−
5
7
µA
8
Input voltage
V_IN
−
0.8
−
6.5
V
−
Current leakage of
output transistor
I_LEAK
V_IN = 6.5 V, V_DOUT = 6.5 V
−
−
0.1
µA
7
*1. V_OUT(S): Specified output voltage
V_OUT(E): Actual output voltage at the fixed load
The output voltage when fixing I_OUT (= 30 mA) and inputting V_OUT(S) + 1.0 V
*2. The output current at which the output voltage becomes lower than 95% of V_OUT(E) after gradually increasing the output
current.
*3. V_drop = V_IN1 − (V_OUT3 × 0.98)
V_OUT3 is the output voltage when V_IN = V_OUT(S) + 1.0 V and I_OUT = 100 mA.
V_IN1 is the input voltage at which the output voltage becomes 98% of V_OUT3 after gradually decreasing the input voltage.
*4. The change in temperature [mV/°C] of the regulator output voltage is calculated using the following equation.
[ ] [ ] [ ] ^∆VOUT
mV/°C
= V *1
OUT(S)
V
*2 _×
∆VOUT
ppm/°C ^*3 ÷ 1000
∆Ta
∆Ta • VOUT
*1. The change in temperature of the output voltage
*2. Specified output voltage
*3. Output voltage temperature coefficient
*5. −V_DET: Actual detection voltage, −V_DET(S): Specified detection voltage
*6. The change in temperature [mV/°C] of the detector detection voltage is calculated using the following equation.
∆−V_DET
∆Ta
[mV/°C]^*1 = −V_DET(S) (Typ.) [V]^*2 ×
∆−V_DET
∆Ta • −V_DET
[ppm/°C]^*3 ÷ 1000
*1. The change in temperature of the detection voltage
*2. Specified detection voltage
*3. Detection voltage temperature coefficient
*7. The output current can be at least this value.
Due to restrictions on the package power dissipation, this value may not be satisfied. Attention should be paid to the power
dissipation of the package when the output current is large. This specification is guaranteed by design.
*8. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
20
Seiko Instruments Inc.