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C501_1 Datasheet, PDF (101/121 Pages) Siemens Semiconductor Group – 8-Bit Single-Chip Microcontroller
Device Specifications
C501
Notes:
1) Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be superimposed on the VOL of ALE
and port 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these
pins make 1-to-0 transitions during bus operation. In the worst case (capacitive loading > 100 pF), the noise
pulse on ALE line may exceed 0.8 V. In such cases it may be desirable to qualify ALE with a schmitt-trigger,
or use an address latch with a schmitt-trigger strobe input.
2) Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall bellow the
0.9 VCC specification when the address lines are stabilizing.
3) IPD (Power Down Mode) is measured under following conditions:
EA = Port0 = VCC; RESET = VSS; XTAL2 = N.C.; XTAL1 = VSS; all other pins are disconnected.
4) ICC (active mode) is measured with:
XTAL1 driven with tCLCH, tCHCL = 5 ns, VIL = VSS + 0.5 V, VIH = VCC – 0.5 V; XTAL2 = N.C.;
EA = Port0 = RESET= VCC; all other pins are disconnected. ICC would be slightly higher if a crystal oscillator is
used (appr. 1 mA).
5) ICC (Idle mode) is measured with all output pins disconnected and with all peripherals disabled;
XTAL1 driven with tCLCH, tCHCL = 5 ns, VIL = VSS + 0.5 V, VIH = VCC – 0.5 V; XTAL2 = N.C.;
RESET = EA = VSS; Port0 = VCC; all other pins are disconnected;
7) ICC max at other frequencies is given by:
active mode: ICC = 1.27 x fOSC + 5.73
idle mode:
ICC = 0.28 x fOSC + 1.45 (C501-L and C501-1R only)
where fOSC is the oscillator frequency in MHz. ICC values are given in mA and measured at VCC = 5 V.
Semiconductor Group
10-4