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HYB25D128160C Datasheet, PDF (27/35 Pages) Qimonda AG – 128-Mbit Double-Data-Rate SDRAM
Internet Data Sheet
HYB25D128xxxC[C/E/F/T](L)
128-Mbit Double-Data-Rate SDRAM
Parameter
Symbol –5
DDR400B
–6
DDR333
Unit Note1)/ Test
Condition
Min.
Max. Min.
Max.
Data-out low-impedance time from tLZ
–0.7
CK/CK
+0.7 –0.7
+0.7 ns —
Mode register set command cycle tMRD
2
time
—
2
—
tCK —
DQ/DQS output hold time
Data hold skew factor
tQH
tQHS
tHP –tQHS
—
—
—
+0.50
+0.50
tHP –tQHS
—
—
—
ns
+0.50 ns
+0.55 ns
—
TFBGA
TSOPII
Active to Autoprecharge delay
Active to Precharge command
Active to Active/Auto-refresh
command period
tRAP
tRAS
tRC
tRCD
40
55
—
tRCD
70E+3 42
—
60
—
ns —
70E+3 ns —
—
ns —
Active to Read or Write delay
tRCD
15
Average Periodic Refresh Interval tREFI
—
Auto-refresh to Active/Auto-refresh tRFC
65
command period
—
18
15.6 —
—
72
—
15.6
—
ns —
µs 10)
ns —
Precharge command period
Read preamble
Read postamble
Active bank A to Active bank B
command
tRP
tRPRE
tRPST
tRRD
15
0.9
0.40
10
—
18
1.1
0.9
0.60 0.40
—
12
—
1.1
0.60
—
ns —
tCK —
tCK —
ns —
Write preamble
tWPRE
Write preamble setup time
tWPRES
Write postamble
tWPST
Write recovery time
tWR
Internal write to read command delay tWTR
Exit self-refresh to non-read
command
tXSNR
0.25
0
0.40
15
2
75
—
0.25
—
0
0.60 0.40
—
15
—
1
—
75
—
—
0.60
—
—
—
tCK —
ns 11)
tCK 12)
ns —
tCK —
ns —
Exit self-refresh to read command tXSRD
200
—
200
—
tCK —
1) 0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); VDDQ = 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V (DDR400)
2) Input slew rate ≥ 1 V/ns for DDR400, DDR333
3) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference level for signals
other than CK/CK, is VREF. CK/CK slew rate are ≥ 1.0 V/ns.
4) Inputs are not recognized as valid until VREF stabilizes.
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is VTT.
6) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock cycle time.
7) tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific
voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
8) Fast slew rate ≥ 1.0 V/ns , slow slew rate ≥ 0.5 V/ns and < 1 V/ns for command/address and CK & CK slew rate > 1.0 V/ns, measured
between VIH(ac) and VIL(ac).
9) These parameters guarantee device timing, but they are not necessarily tested on each device.
10) A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.
Rev. 1.6, 2007-02
27
03292006-U5AN-6TI1