SAA5X9X Datasheet, PDF (61/68 Pages) NXP Semiconductors – Economy teletext and TV microcontrollers

Philips Semiconductors
Economy teletext and TV microcontrollers
Preliminary specification
SAA5x9x family
14 QUALITY SPECIFICATIONS
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E”; “Quality Reference Handbook, order number 9398 510 63011”. The principal
requirements are shown in Table 25 to 28.
Table 25 Acceptance tests per lot; note 1
TEST
Mechanical
Electrical
cumulative target: <80 ppm
cumulative target: <80 ppm
REQUIREMENTS
Table 26 Processability tests (by package family); note 2
TEST
solderability
<7% LTPD
mechanical
<15% LTPD
solder heat resistance <15% LTPD
REQUIREMENTS
Table 27 Reliability tests (by process family); note 3
TEST
operational life
humidity life
temperature cycling
performance
CONDITIONS
168 hours at T_j = 150 °C
temperature, humidity, bias 1000 hours, 85 °C, 85% RH
(or equivalent test)
T_stg(min) to T_stg(max)
REQUIREMENTS
<1000 FPM at T_j = 70 °C
<2000 FPM
<2000 FPM
Table 28 Reliability tests (by device type)
TEST
ESD and latch-up
CONDITIONS
ESD Human body model 100 pF, 1.5 kΩ
ESD Machine model 200 pF, 0 Ω
latch-up
REQUIREMENTS
2000 V
200 V
100 mA, 1.5 × V_DD (absolute maximum)
Notes to Tables 25, 26 and 27
1. ppm = fraction of defective devices, in parts per million.
2. LTPD = Lot Tolerance Percent Defective.
3. FPM = fraction of devices failing at test condition, in failures per million.
1997 Jul 07
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