AND8090 Datasheet, PDF (3/20 Pages) ON Semiconductor – AC Characteristics of ECL Devices

AND8090/D
Test Bench Equipment
AC characterization equipment is carefully selected to
ensure that the test equipment is suitable for the devices
to be tested, and that the measurements are accurate
and repeatable. For example, sampling head bandwidth
must be wide enough for accurate rise and fall time
measurements. The test equipment that is currently used by
ON Semiconductor is listed in Table 1. Further information
on the test equipment can be found at the respective
manufacturer’s website.
Table 1. ON Semiconductor Test Bench Equipment
Test Equipment
Manufacturer/Model
Digital Sampling Oscilloscope
Tektronix 11801C
SD24/26 20 GHz Module
Digital Sampling Oscilloscope
Tektronix TDS8000
80E03 20 GHz Module
80E01 50 GHz Module
Pulse/Pattern Generators
DC Power Supplies
Tektronix HFS 9009
Agilent 8133A
Advantest D3186
Agilent HP6624A
Test Cables
Air Flow Regulator
Various Manufacturers
Temptronics Thermostream
Equipment Notes
Customers can use lower performance equipment for evaluation,
but may not be able to duplicate all of ON Semiconductor
measurements (e.g., rise/fall and propagation delay times).
Customers can use lower performance equipment for evaluation,
but may not be able to duplicate all of ON Semiconductor
measurements (e.g., rise/fall and propagation delay times). Note
that the 50 GHz sampling module is required for GigaComm
devices as they typically have rise and fall times between 20 ps
and 50 ps.
Maximum pulse frequency of 630 MHz.
Maximum pulse frequency of 3.0 GHz.
Maximum pulse frequency of 12 GHz.
Used to supply V_CC, V_EE, and specialized bias voltages.
Low−resistance supply voltage connections and RF quality supply
filter capacitors are designed into the AC test boards that are used
to mount the DUT.
High bandwidth, low−loss matched cables are used to ensure
accurate measurements. Each cable of an input/output cable pair
is the same length and has a characteristic impedance of 50 ohms.
Establishes the DUT ambient temperature.
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