AND8090 Datasheet, PDF (2/20 Pages) ON Semiconductor – AC Characteristics of ECL Devices

AND8090/D
LAB TESTING
Test Bench Overview
Specialized test benches are used to determine the AC
characteristics of the Device−Under−Test (DUT). A typical
test bench setup for a differential device is shown in
Figure 1.
Test Initialization
• The test cables are connected from the pulse generator to
the appropriate DUT test board input connectors.
• The test cables are connected from the DUT test board
output connectors to the appropriate digital sampling
oscilloscope input connectors.
• The power supply cables are connected to the DUT test
board power supply connectors.
• The airflow regulator is set to 500 lfpm and the desired
DUT ambient air temperature. The DUT is in this
environment for a minimum of 3 minutes before testing
begins. Data sheet specifications are typically given for
−40°C, 25°C, and 85°C.
TRIGGER
50 W COAX
50 W COAX
V_CC
Q
PULSE
GENERATOR
Q
50 W COAX
50 W COAX
D
Q
50 W COAX
D
Q
50 W COAX
Test Board
V_EE
Figure 1. AC Characterization Test Bench Setup
TRIGGER
CHANNEL A (50 W)
CHANNEL B (50 W)
OSCILLOSCOPE
CHANNEL C (50 W)
CHANNEL D (50 W)
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