E1993A Datasheet, PDF (22/40 Pages) Keysight Technologies – W-CDMA Mobile Test Application

22 | Keysight | E1963A W-CDMA Mobile Test Application - Technical Overview
Waveform quality measurement
Waveform quality measurement: Composite EVM
Measurement format: HPSK
Measurement chip rate: 3.84 Mcps
Input level range: –25 to +28 dBm/3.84 MHz
Measurement range: ≤ 35% EVM
Measurement interval: 1 timeslot
Measurement accuracy (including the effects of residual EVM):
Band VII
All other bands
3.5
3.0
2.5
2.0
Typical UE
EVM range
1.5
1.0
0.5
0.0
0
2
4
6
8 10 12 14 16
EU EVM (% rms)
EVM measurement accuracy:
–– < 2.8% rms (typically < 2.4% rms) for UE EVM ≥ 1% rms, ≤ 2200 MHz
–– < 3.2% rms (typically < 2.8% rms) for UE EVM ≥ 1% rms, 2300 to 2580 MHz
Other reported parameters with EVM:
–– Frequency error
–– Magnitude error
–– Phase error
–– Origin offset
–– Timing error
–– Peak code domain error
Frequency error measurement range: ±1 kHz