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TLE9877QXA20_15 Datasheet, PDF (98/122 Pages) Infineon Technologies AG – Microcontroller with LIN and BLDC MOSFET Driver for Automotive Applications | |||
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TLE9877QXA20
Electrical Characteristics
Table 30 DC Characteristics Port0, Port1 (contâd)
VS = 5.5 V to 28 V, Tj = -40 °C to +150 °C, all voltages with respect to ground, positive current flowing into pin
(unless otherwise specified)
Parameter
Symbol
Min.
Values
Typ. Max.
Unit Note /
Number
Test Condition
Input low voltage
VIL
-0.3
â
0.3 x VDDP V 2)4.5V ⤠VDDP ⤠P_5.1.3
5.5V
Input low voltage
Input high voltage
VIL_extend -0.3
VIH
0.7 x VDDP
0.42 x â
V
VDDP
â
VDDP + 0.3 V
1)2.6V ⤠VDDP â¤
4.5V
2)4.5V ⤠VDDP â¤
5.5V
P_5.1.17
P_5.1.4
Input high voltage
Output low voltage
Output low voltage
Output high voltage
Output high voltage
Input leakage current
VIH_extend â
VOL
â
VOL
â
VOH
VDDP - 1.0
VOH
VDDP - 0.4
IOZ2
-5
0.52 x VDDP + 0.3 V
VDDP
â
1.0
V
â
0.4
V
â
â
V
â
â
V
â
+5
µA
1)2.6V ⤠VDDP â¤
4.5V
3) 4) IOL ⤠IOLmax
3) 5) IOL ⤠IOLnom
3) 4) IOH ⥠IOHmax
3) 5) IOH ⥠IOHnom
6) TJ ⤠85°C,
0.45 V < VIN
< VDDP
P_5.1.18
P_5.1.6
P_5.1.7
P_5.1.8
P_5.1.9
P_5.1.10
Input leakage current
IOZ2
-15
Pull level keep current
IPLK
Pull level force current
IPLF
Pin capacitance
CIO
-200
-1.5
â
â
+15
µA TJ ⤠150°C,
0.45 V < VIN
< VDDP
P_5.1.11
â
+200
µA 7) VPIN ⥠VIH (up) P_5.1.12
VPIN ⤠VIL (dn)
â
+1.5
mA 7) VPIN ⤠VIL (up) P_5.1.13
VPIN ⥠VIH (dn)
â
10
pF 1)
P_5.1.14
Reset Pin Timing
Reset Pin Input Filter Time Tfilt_RESET â
5
â
1) Not subject to production test, specified by design.
µs 1)
P_5.1.19
2) Tested at VDDP = 5V, specified for 4.5V < VDDP < 5.5V.
3) The maximum deliverable output current of a port driver depends on the selected output driver mode. The limit for pin
groups must be respected.
4) Tested at 4.9V < VDDP < 5.1V, IOL = 4mA, IOH = -4mA, specified for 4.5V < VDDP < 5.5V.
5) As a rule, with decreasing output current the output levels approach the respective supply level (VOLâGND, VOHâVDDP).
Tested at 4.9V < VDDP < 5.1V, IOL = 1mA, IOH = -1mA.
6) The given values are worst-case values. In production tests, this leakage current is only tested at 150°C; other values are
ensured by correlation. For derating, please refer to the following descriptions:
Leakage derating depending on temperature (TJ = junction temperature [°C]):
IOZ = 0.05 à e(1.5 + 0.028ÃTJ) [µA]. For example, at a temperature of 95°C the resulting leakage current is 3.2 µA.
Leakage derating depending on voltage level (DV = VDDP - VPIN [V]):
IOZ = IOZtempmax - (1.6 à DV) [µA]
This voltage derating formula is an approximation which applies for maximum temperature.
Data Sheet
98
Rev. 1.0, 2015-04-30
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