TLE9877QXA20_15 Datasheet, PDF (79/122 Pages) Infineon Technologies AG – Microcontroller with LIN and BLDC MOSFET Driver for Automotive Applications

TLE9877QXA20
28.2
ESD Immunity According to IEC61000-4-2
Application Information
Note: Tests for ESD immunity according to IEC61000-4-2 “Gun test” (150pF, 330Ω) has been performed. The
results and test condition will be available in a test report.
Table 16 ESD “Gun Test”
Performed Test
Result
Unit
Remarks
ESD at pin LIN, versus
>6
kV
GND¹⁾
2)_{positive pulse}
ESD at pin LIN, versus
< -6
kV
GND¹⁾
2)_{negative pulse}
1) ESD test “ESD GUN” is specified with external components; see application diagram:
C_MON = 100nF, R_MON = 1kΩ, C_LIN = 220pF, C_VS = >20µF ELCO + 100nF ESR < 1Ω, C_VSD = 1µF, R_VSD = 2Ω.
2) ESD susceptibility “ESD GUN” according to LIN EMC Test Specification, Section 4.3 (IEC 61000-4-2). To be tested by
external test house (IBEE Zwickau)
Data Sheet
79
Rev. 1.0, 2015-04-30