TC1767 Datasheet, PDF (94/126 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1767
Electrical Parameters
Table 12 ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter
Symbol
Min.
Switched
capacitance at
the analog
voltage inputs
C_AINSW
–
CC
ON resistance of R_AIN
the transmission
gates in the
analog voltage
path
CC –
ON resistance
for the ADC test
(pull-down for
AIN7)
R_AIN7T CC 180
Values
Typ. Max.
7
20
Unit Note /
Test Condition
pF
8)18)
700 1500 Ω
8)
550 900¹⁹⁾ Ω
Test feature
available only for
AIN7 ^{8) 20)}
Current through I_AIN7T
resistance for the
ADC test (pull-
down for AIN7)
CC –
15 30
rms peak
mA Test feature
available only for
AIN7⁸⁾
1) Voltage overshoot up to 4 V is permissible at Power-Up and PORST low, provided the pulse duration is less
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
2) Voltage overshoot up to 1.7 V is permissible at Power-Up and PORST low, provided the pulse duration is less
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoot).
4) If the reference voltage V_AREF increases or the V_DDM decreases, so that
V_AREF = (V_DDM + 0.05 V to V_DDM + 0.07 V), then the accuracy of the ADC decreases by 4 LSB12.
5) If a reduced reference voltage in a range of V_DDM/2 to V_DDM is used, then the ADC converter errors increase.
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to V_DDM/2 is used, then there are additional decrease in the
ADC speed and accuracy.
6) TUE is tested at V_AREF = 5.0 V, V_AGND = 0 V and V_DDM = 5.0 V
7) ADC module capability.
8) Not subject to production test, verified by design / characterization.
9) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
10) For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
11) The leakage current definition is a continuous function, as shown in Figure 19. The numerical values defined
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
Data Sheet
90
V1.3, 2009-09