TLE8262-2E Datasheet, PDF (17/94 Pages) Infineon Technologies AG – Universal System Basis Chip

TLE8262-2E
General Product Characteristics
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
5.2
Functional Range
Pos. Parameter
Symbol
Limit Values Unit Test Conditions
Min.
Max.
5.2.1 Supply Voltage
5.2.2 Supply Voltage
V_S
V_{UV OFF} 28
V_S
V_{UV OFF} 40
V
After V_S rising above
V_{UV ON};¹⁾
V
2)_{tpulse = 400 ms}
40 V load dump;
Ri = 2Ω
5.2.3 SPI Clock Frequency
f_clkSPI
–
4
MHz ³⁾V_S > 5.5 V
5.2.4 SPI Clock Frequency
f_clkSPI
–
1
MHz If V_{UV ON}> V_S> V_{UV OFF};
5.2.5 Junction Temperature
T_j
-40
150
°C –
5.2.6 Undervoltage “OFF”
V_{UV OFF} 3
4
V
-¹⁾
5.2.7 Undervoltage “ON
V_{UV ON} 4.5
5.5
V
-¹⁾
5.2.8 Supply Voltage for Limp Home
V_{S_LH}
5.5
40
Output Active
V
Pull up to V_S
R_LHO = 40kΩ
1) In the case V_s < V_UVOFF, the SBC is switched OFF and will restart in INIT Mode at next V_s rising.
2) During load dump, the others pins remains in their absolute maximum ratings
3) Not subject to production test, specified by design
Note: Within the functional range the IC operates as described in the circuit description. The electrical
characteristics are specified within the conditions given in the related electrical characteristics table.
Data Sheet
17
Rev. 1.0, 2009-05-26