HY29LV400 Datasheet, PDF (24/40 Pages) Hynix Semiconductor – 4 Mbit (512K x 8/256K x 16) Low Voltage Flash Memory

HY29LV400
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
TEST CONDITIONS
+ 3.3V
DEVICE
UNDER
TEST
C_L
6.2
KOhm
2.7
KOhm
All diodes
are
1N3064
or
equivalent
Figure 13. Test Setup
Table 12. Test Specifications
Test
Condition
- 55
- 70
- 90
Unit
Output Load
1 TTL Gate
Output Load Capacitance (C_L) 30 100 pF
Input Rise and Fall Times
5
ns
Input Signal Low Level
0.0
V
Input Signal High Level
3.0
V
Low Timing Measurement
Signal Level
1.5
V
High Timing Measurement
Signal Level
1.5
V
Note: Timing measurements are made at the reference lev-
els specified above regardless of where the illustrations in
the timing diagrams appear to indicate the measurement is
made
3.0 V
0.0 V
Input 1.5 V
Measurement Level
1.5 V Output
Figure 14. Input Waveforms and Measurement Levels
24
Rev. 1.0/Nov. 01