MC9S12DT128CPVE Datasheet, PDF (99/128 Pages) Freescale Semiconductor, Inc – Device User Guide

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A.2.3 ATD accuracy
Table A-10 specifies the ATD conversion performance excluding any errors due to current injection,
input capacitance and source resistance.
Table A-10 ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
V_REF = V_RH - V_RL = 5.12V. Resulting to one 8 bit count = 20mV and one 10 bit count = 5mV
f_ATDCLK = 2.0MHz
Num C
Rating
Symbol Min
Typ
1 P 10-Bit Resolution
LSB
5
2 P 10-Bit Differential Nonlinearity
DNL
–1
3 P 10-Bit Integral Nonlinearity
INL
–2.5
±1.5
4 P _{10-Bit Absolute Error}¹
AE
-3
±2.0
5 P 8-Bit Resolution
LSB
20
6 P 8-Bit Differential Nonlinearity
DNL
–0.5
7 P 8-Bit Integral Nonlinearity
INL
–1.0
±0.5
8 P _{8-Bit Absolute Error}⁽¹⁾
AE
-1.5
±1.0
NOTES:
1. These values include the quantization error which is inherently 1/2 count for any A/D converter.
Max
1
2.5
3
0.5
1.0
1.5
Unit
mV
Counts
Counts
Counts
mV
Counts
Counts
Counts
For the following definitions see also Figure A-1.
Differential Non-Linearity (DNL) is defined as the difference between two adjacent switching steps.
DNL(i) = ^V-----i_1--^–--L---VS----ⁱ-B--^–---¹-- – 1
The Integral Non-Linearity (INL) is defined as the sum of all DNLs:
∑ INL(n) = n DNL(i) = V---1--n-L---–-S----V-B---0- – n
i=1
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