MC9S08JM60_09 Datasheet, PDF (370/388 Pages) Freescale Semiconductor, Inc – HCS08 Microcontrollers

Appendix A Electrical Characteristics
2 _{The frequency of this clock is controlled by a software setting.}
3 _{These values are hardware state machine controlled. User code does not need to count cycles. This information}
supplied for calculating approximate time to program and erase.
4 _{Typical endurance for Flash is based on the intrinsic bitcell performance. For additional information on how}
Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical
Endurance for Nonvolatile Memory.
5 _{Typical data retention values are based on intrinsic capability of the technology measured at high temperature and}
de-rated to 25 °C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines
typical data retention, please refer to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.
A.14 USB Electricals
The USB electricals for the S08USBV1 module conform to the standards documented by the Universal
Serial Bus Implementers Forum. For the most up-to-date standards, visit http://www.usb.org.
If the Freescale S08USBV1 implementation has electrical characteristics that deviate from the standard or
require additional information, this space would be used to communicate that information.
Table A-17. Internal USB 3.3V Voltage Regulator Characteristics
Symbol
Unit
Min
Typ
Max
Regulator operating voltage
V_regin
V
VREG output
V_regout
V
V_USB33 input with internal
V_usb33in
V
VREG disabled
3.9
—
5.5
3
3.3
3.6
3
3.3
3.6
VREG Quiescent Current
I_VRQ
mA
—
0.5
—
A.15 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer must consult Freescale applications notes such as AN2321, AN1050, AN1263, AN2764,
and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.15.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
MC9S08JM60 Series Data Sheet, Rev. 3
370
Freescale Semiconductor