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K20P144M100SF2 Datasheet, PDF (20/67 Pages) Freescale Semiconductor, Inc – K20 Sub-Family Data Sheet
Peripheral operating requirements and behaviors
5.3.1 Thermal operating requirements
Table 9. Thermal operating requirements
Symbol
TJ
TA
Description
Die junction temperature
Ambient temperature
Min.
Max.
Unit
–40
125
°C
–40
105
°C
5.3.2 Thermal attributes
Board
type
Single-
layer (1s)
Four-layer
(2s2p)
Single-
layer (1s)
Symbol
RθJA
RθJA
RθJMA
Description
Thermal resistance, junction to ambient (natural
convection)
Thermal resistance, junction to ambient (natural
convection)
Thermal resistance, junction to ambient (200 ft./
min. air speed)
y 144
LQFP
r 52
144 Unit
MAPBGA
50
°C/W
a 44
30
°C/W
in43
41
°C/W
Notes
1
1
1
Four-layer RθJMA
Thermal resistance, junction to ambient (200 ft./ 38
27
°C/W
(2s2p)
min. air speed)
—
RθJB
Thermal resistance, junction to board
33
17
°C/W
lim —
RθJC
Thermal resistance, junction to case
11
10
°C/W
—
ΨJT
Thermal characterization parameter, junction to 2
2
°C/W
6 Peripheral operPatingrreequirements and behaviors package top outside center (natural convection)
1
2
3
4
6.1 Core modules
1. Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test Method
Environmental Conditions—Forced Convection (Moving Air).
2. Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental Conditions
—Junction-to-Board.
3. Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material between
the top of the package and the cold plate.
4. Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
K20 Sub-Family Data Sheet Data Sheet, Rev. 1, 11/2010.
20
Preliminary
Freescale Semiconductor, Inc.