908E621_08 Datasheet, PDF (18/65 Pages) Freescale Semiconductor, Inc – Integrated Quad Half-bridge and Triple High Side with Embedded MCU and LIN for High End Mirror

TIMING DIAGRAMS
DYNAMIC ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
LIN, L0
10k
1nF
Transient Pulse
Generator
Note: Waveform in accordance to ISO7637 part 1, test pulses 1, 2, 3a and 3b.
Figure 4. Test Circuit for Transient Test Pulses
V^VS^SU^UP^P
908E621
18
TXD
RXD
R0
LIN
R• _{10.R-0a10knkΩa}d_OnCa_{dhn0mCdC0a1onc.d}m0_omn1bF_nbin_Fina_ati_to_ion_ns_s:_:
• 60_- 0₆₆Ω₀a_On_hd_m6._a8_nn_dF_6.8nF
C0
• 50_- 0₅₀Ω₀a_On_hd_m10_ann_dF _10nF
Figure 5. Test Circuit for LIN Timing Measurements
TXD
VLIN
LIN
RXD
tDOM-MIN
58.1% VSUP
40% VSUP
tDOM-MAX
28.4% VSUP
tREC-MAX
74.4% VSUP
60% VSUP
42.2% VSUP
tREC-MIN
tRL
tRH
Figure 6. LIN Timing Measurements for Normal Slew Rate
Analog Integrated Circuit Device Data
Freescale Semiconductor