MC33912_10 Datasheet, PDF (17/94 Pages) Freescale Semiconductor, Inc – LIN System Basis Chip with DC Motor Pre-driver and Current Sense

MC33912G5AC / MC34912G5AC
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ V_SUP ≤ 18 V, -40°C ≤ T_A ≤ 125°C for the 33912 and -40°C ≤ T_A ≤ 85°C for the
34912, unless otherwise noted. Typical values noted reflect the approximate parameter mean at T_A = 25°C under nominal
conditions, unless otherwise noted.
L1, L2, L3 AND L4 INPUTS
Lx Filter Time Deglitcher⁽⁴⁹⁾
Characteristic
STATE MACHINE TIMING
Symbol
Min
Typ
Max
Unit
t _WUF
8.0
20
38
μs
Delay Between CS LOW-to-HIGH Transition (at End of SPI Stop Command)
and Stop Mode Activation⁽⁴⁹⁾
t _STOP
–
μs
–
5.0
Normal Request Mode Timeout (see Figure 12, page 23)
Cyclic Sense ON Time from Stop and Sleep mode⁽⁵⁰⁾
Cyclic Sense Accuracy⁽⁴⁹⁾
Delay Between SPI Command and HS /LS Turn On⁽⁵¹⁾
9.0 V < V_SUP < 27 V
t _{NR TOUT}
110
150
205
ms
T_ON
130
200
270
µs
-35
+35
%
t _S-ON
–
μs
–
10
Delay Between SPI Command and HS /LS Turn Off⁽⁵¹⁾
9.0 V < V_SUP < 27 V
t _S-OFF
–
μs
–
10
Delay Between Normal Request and Normal mode After a Watchdog Trigger
Command (Normal Request Mode)⁽⁴⁹⁾
t _SNR2N
–
μs
–
10
Delay Between CS Wake-up (CS LOW to HIGH) in Stop mode and:
Normal Request mode, VDD ON and RST HIGH
First Accepted SPI Command
μs
t _WUCS
9.0
15
80
t _WUSPI
90
—
N/A
Minimum Time Between Rising and Falling Edge on the CS
t _2CS
4.0
—
—
μs
J2602 DEGLITCHER
V_SUP Deglitcher⁽⁵²⁾
(DIS_J2602 = 0)
t_{J2602_DEG}
μs
35
50
70
Notes
49. This parameter is guaranteed by process monitoring but not production tested.
50. This parameter is 100% tested on an Automatic Tester. However, since it has not been monitored during reliability stresses, Freescale
does not guarantee this parameter during the product's life time.
51. Delay between turn on or off command (rising edge on CS) and HS or LS ON or OFF, excluding rise or fall time due to external load.
52. This parameter has not been monitoring during operating life test.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33912
17